HC

Hsueh-Chung Chen

IBM: 71 patents #1,021 of 70,183Top 2%
UM United Microelectronics: 26 patents #190 of 4,560Top 5%
TSMC: 16 patents #1,982 of 12,232Top 20%
Globalfoundries: 12 patents #298 of 4,424Top 7%
IT ITRI: 6 patents #1,152 of 9,619Top 15%
SS Stmicroelectronics Sa: 2 patents #601 of 1,676Top 40%
Infineon Technologies Ag: 2 patents #3,160 of 7,486Top 45%
GU Globalfoundries U.S.: 1 patents #344 of 665Top 55%
Samsung: 1 patents #49,284 of 75,807Top 70%
ET Elpis Technologies: 1 patents #31 of 121Top 30%
📍 Cohoes, NY: #3 of 185 inventorsTop 2%
🗺 New York: #321 of 115,490 inventorsTop 1%
Overall (All Time): #8,510 of 4,157,543Top 1%
129
Patents All Time

Issued Patents All Time

Showing 26–50 of 129 patents

Patent #TitleCo-InventorsDate
11398409 Method of forming a BEOL interconnect structure using a subtractive metal via first process Yann Mignot, Yongan Xu 2022-07-26
11398378 Metal on metal multiple patterning Ravi Prakash Srivastava, Somnath Ghosh, Nicholas V. LiCausi, Terry A. Spooner, Sean Reidy 2022-07-26
11328954 Bi metal subtractive etch for trench and via formation Yann Mignot, Chanro Park, Chih-Chao Yang, Injo Ok 2022-05-10
11302571 Cut integration for subtractive first metal line with bottom up second metal line Somnath Ghosh, Yongan Xu, Yann Mignot, Lawrence A. Clevenger 2022-04-12
11171001 Multiple patterning scheme integration with planarized cut patterning Yongan Xu, Lawrence A. Clevenger, Yann Mignot, Cornelius Brown Peethala 2021-11-09
11164778 Barrier-free vertical interconnect structure Junli Wang, Su Chen Fan, Yann Mignot, Lawrence A. Clevenger 2021-11-02
11152298 Metal via structure Yann Mignot, James J. Kelly, Muthumanickam Sankarapandian, Yongan Xu, Daniel J. Vincent 2021-10-19
11133216 Interconnect structure Roger A. Quon, Chih-Chao Yang 2021-09-28
11107727 Double metal double patterning with vias extending into dielectric Yann Mignot 2021-08-31
11094527 Wet clean solutions to prevent pattern collapse Cornelius Brown Peethala, Chih-Chao Yang, Raghuveer R. Patlolla 2021-08-17
11087993 Double replacement metal line patterning Ruilong Xie, Chih-Chao Yang, Kangguo Cheng 2021-08-10
11075161 Large via buffer Yann Mignot, Junli Wang, Chi-Chun Liu, Mary Claire Silvestre 2021-07-27
11069564 Double metal patterning Yongan Xu, Yann Mignot, James J. Kelly, Lawrence A. Clevenger 2021-07-20
11063126 Metal contact isolation for semiconductor structures Su Chen Fan, Yann Mignot, James J. Kelly 2021-07-13
11056426 Metallization interconnect structure formation Yann Mignot, Hosadurga Shobha, Chih-Chao Yang 2021-07-06
11024551 Metal replacement vertical interconnections for buried capacitance Lawrence A. Clevenger, Daniel James Dechene, Somnath Ghosh, Carl Radens 2021-06-01
11004736 Integrated circuit having a single damascene wiring network Junli Wang, Somnath Ghosh, Chih-Chao Yang, Lawrence A. Clevenger 2021-05-11
10971356 Stack viabar structures Su Chen Fan, Yann Mignot, James J. Kelly, Terence B. Hook 2021-04-06
10937653 Multiple patterning scheme integration with planarized cut patterning Yongan Xu, Lawrence A. Clevenger, Yann Mignot, Cornelius Brown Peethala 2021-03-02
10833010 Integration of artificial intelligence devices Lawrence A. Clevenger, Fee Li Lie, Effendi Leobandung 2020-11-10
10825726 Metal spacer self aligned multi-patterning integration James J. Kelly, Yann Mignot, Cornelius Brown Peethala, Lawrence A. Clevenger 2020-11-03
10818494 Metal on metal multiple patterning Ravi Prakash Srivastava, Somnath Ghosh, Nicholas V. LiCausi, Terry A. Spooner, Sean Reidy 2020-10-27
10811310 Metal spacer self aligned double patterning with airgap integration James J. Kelly, Yann Mignot, Cornelius Brown Peethala, Lawrence A. Clevenger 2020-10-20
10784119 Multiple patterning with lithographically-defined cuts Ravi Prakash Srivastava, Steven McDermott, Martin O'Toole, Brendan O'Brien, Terry A. Spooner 2020-09-22
10741439 Merge mandrel features Martin O'Toole, Terry A. Spooner, Jason E. Stephens 2020-08-11