RS

Ravi Prakash Srivastava

Globalfoundries: 23 patents #124 of 4,424Top 3%
GP Globalfoundries Singapore Pte.: 3 patents #212 of 828Top 30%
Infineon Technologies Ag: 2 patents #4,439 of 7,486Top 60%
GU Globalfoundries U.S.: 2 patents #206 of 665Top 35%
IBM: 2 patents #32,839 of 70,183Top 50%
AM AMD: 2 patents #3,994 of 9,279Top 45%
TC Toshiba America Electronic Components: 1 patents #23 of 77Top 30%
CR Council Of Scientific And Industrial Research: 1 patents #1,642 of 4,648Top 40%
CM Chartered Semiconductor Manufacturing: 1 patents #419 of 840Top 50%
Samsung: 1 patents #49,284 of 75,807Top 70%
📍 Clifton Park, NY: #88 of 1,126 inventorsTop 8%
🗺 New York: #3,998 of 115,490 inventorsTop 4%
Overall (All Time): #121,611 of 4,157,543Top 3%
30
Patents All Time

Issued Patents All Time

Showing 1–25 of 30 patents

Patent #TitleCo-InventorsDate
12276831 Enlarged multilayer nitride waveguide for photonic integrated circuit Shesh Mani Pandey, Yusheng Bian 2025-04-15
11417525 Multiple patterning with mandrel cuts defined by block masks Martin O'Toole, Keith Donegan, Brendan O'Brien, Hsueh-Chung Chen, Terry A. Spooner +4 more 2022-08-16
11398378 Metal on metal multiple patterning Hsueh-Chung Chen, Somnath Ghosh, Nicholas V. LiCausi, Terry A. Spooner, Sean Reidy 2022-07-26
10833022 Structure and method to improve overlay performance in semiconductor devices Cung D. Tran, Huaxiang Li, Bradley Morgenfeld, Xintuo Dai, Sanggil Bae +7 more 2020-11-10
10818494 Metal on metal multiple patterning Hsueh-Chung Chen, Somnath Ghosh, Nicholas V. LiCausi, Terry A. Spooner, Sean Reidy 2020-10-27
10818557 Integrated circuit structure to reduce soft-fail incidence and method of forming same Sipeng Gu, Akshey Sehgal, Xinyuan Dou, Sunil Kumar Singh, Haiting Wang +1 more 2020-10-27
10784119 Multiple patterning with lithographically-defined cuts Hsueh-Chung Chen, Steven McDermott, Martin O'Toole, Brendan O'Brien, Terry A. Spooner 2020-09-22
10770344 Chamferless interconnect vias of semiconductor devices Yuping Ren, Haigou Huang, Zhiguo Sun, Qiang Fang, Cheng Xu +1 more 2020-09-08
10714380 Method of forming smooth sidewall structures using spacer materials Sipeng Gu, Sunil Kumar Singh, Xinyuan Dou, Akshey Sehgal, Zhiguo Sun 2020-07-14
10692812 Interconnects with variable space mandrel cuts formed by block patterning Hui Zang, Jiehui Shu 2020-06-23
10504851 Structure and method to improve overlay performance in semiconductor devices Cung D. Tran, Huaxiang Li, Bradley Morgenfeld, Xintuo Dai, Sanggil Bae +7 more 2019-12-10
10504774 Lithographic patterning to form fine pitch features Sunil Kumar Singh, Sohan S. Mehta, SherJang Singh 2019-12-10
10497610 Dual photoresist approach to lithographic patterning for pitch reduction Sunil Kumar Singh 2019-12-03
10395941 SADP method with mandrel undercut spacer portion for mandrel space dimension control Hsueh-Chung Chen 2019-08-27
10347528 Interconnect formation process using wire trench etch prior to via etch, and related interconnect Sunil Kumar Singh, Sipeng Gu, Akshey Sehgal 2019-07-09
10312188 Interconnect structure with method of forming the same Sunil Kumar Singh 2019-06-04
10192780 Self-aligned multiple patterning processes using bi-layer mandrels and cuts formed with block masks Xiaohan Wang, Jiehui Shu, Brendan O'Brien, Terry A. Spooner, Jinping Liu 2019-01-29
9691654 Methods and devices for back end of line via formation Sunil Kumar Singh, Sohan S. Mehta 2017-06-27
9613909 Methods and devices for metal filling processes Sunil Kumar Singh, Nicholas Robert STOKES 2017-04-04
9576894 Integrated circuits including organic interlayer dielectric layers and methods for fabricating the same Sunil Kumar Singh, Xusheng Wu, Akshey Sehgal, Teck Jung Tang 2017-02-21
9362162 Methods of fabricating BEOL interlayer structures Sunil Kumar Singh, Teck Jung Tang, Mark A. Zaleski 2016-06-07
9293363 Methods and structures for back end of line integration Sunil Kumar Singh, Mark A. Zaleski, Akshey Sehgal 2016-03-22
9117822 Methods and structures for back end of line integration Sunil Kumar Singh, Mark A. Zaleski, Akshey Sehgal 2015-08-25
8932961 Critical dimension and pattern recognition structures for devices manufactured using double patterning techniques Sohan S. Mehta, Tong Qing Chen, Vikrant Chauhan, Catherine B. Labelle, Mark Kelling 2015-01-13
8822342 Method to reduce depth delta between dense and wide features in dual damascene structures Oluwafemi. O. Ogunsola, Craig Child, Muhammed Shafi Pallachalil, Habib Hichri, Matthew S. Angyal +1 more 2014-09-02