DC

Dureseti Chidambarrao

IBM: 223 patents #132 of 70,183Top 1%
Globalfoundries: 2 patents #1,397 of 4,424Top 35%
MG Mentor Graphics: 2 patents #191 of 698Top 30%
Samsung: 2 patents #37,631 of 75,807Top 50%
Infineon Technologies Ag: 1 patents #4,439 of 7,486Top 60%
KT Kabushiki Kaisha Toshiba: 1 patents #13,537 of 21,451Top 65%
📍 Weston, CT: #1 of 210 inventorsTop 1%
🗺 Connecticut: #16 of 34,797 inventorsTop 1%
Overall (All Time): #2,436 of 4,157,543Top 1%
230
Patents All Time

Issued Patents All Time

Showing 101–125 of 230 patents

Patent #TitleCo-InventorsDate
7696025 Sidewall semiconductor transistors Huilong Zhu, Lawrence A. Clevenger, Omer H. Dokumaci, Kaushik A. Kumar, Carl Radens 2010-04-13
7691712 Semiconductor device structures incorporating voids and methods of fabricating such structures Ricardo A. Donaton, Jack A. Mandelman 2010-04-06
7691698 Pseudomorphic Si/SiGe/Si body device with embedded SiGe source/drain Anda C. Mocuta, Dan M. Mocuta, Carl Radens 2010-04-06
7687829 Stressed field effect transistors on hybrid orientation substrate Judson R. Holt, Meikei Ieong, Qiqing C. Ouyang, Siddhartha Panda 2010-03-30
7683428 Vertical Fin-FET MOS devices Jochen Beintner, Ramachandra Divakaruni 2010-03-23
7675118 Semiconductor structure with enhanced performance using a simplified dual stress liner configuration Yaocheng Liu, William K. Henson 2010-03-09
7659581 Transistor with dielectric stressor element fully underlying the active semiconductor region Brian J. Greene, Kern Rim 2010-02-09
7659160 Field effect transistors (FETS) with inverted source/drain metallic contacts, and method of fabrication same Michael P. Belyansky, Lawrence A. Clevenger, Kaushik A. Kumar, Carl Radens 2010-02-09
7655972 Structure and method for MOSFET with reduced extension resistance Carl Radens 2010-02-02
7655511 Gate electrode stress control for finFET performance enhancement 2010-02-02
7648871 Field effect transistors (FETS) with inverted source/drain metallic contacts, and method of fabricating same Michael P. Belyansky, Lawrence A. Clevenger, Kaushik A. Kumar, Carl Radens 2010-01-19
7645656 Structure and method for making strained channel field effect transistor using sacrificial spacer Huajie Chen, Sang-Hyun Oh, Siddhartha Panda, Werner Rausch, Tsutomu Sato +1 more 2010-01-12
7632724 Stressed SOI FET having tensile and compressive device regions William K. Henson, Yaocheng Liu 2009-12-15
7618853 Field effect transistors with dielectric source drain halo regions and reduced miller capacitance Michael P. Belyansky, Oleg Gluschenkov 2009-11-17
7615454 Embedded stressed nitride liners for CMOS performance improvement Omer H. Dokumaci 2009-11-10
7615418 High performance stress-enhance MOSFET and method of manufacture Ricardo A. Donaton, William K. Henson, Kern Rim 2009-11-10
7608489 High performance stress-enhance MOSFET and method of manufacture Ricardo A. Donaton, William K. Henson, Kern Rim 2009-10-27
7573104 CMOS device on hybrid orientation substrate comprising equal mobility for perpendicular devices of each type 2009-08-11
7560326 Silicon/silcion germaninum/silicon body device with embedded carbon dopant Anda C. Mocuta, Ricardo A. Donaton, David M. Onsongo, Kern Rim 2009-07-14
7560328 Strained Si on multiple materials for bulk or SOI substrates Omer H. Dokumaci, Oleg Gluschenkov, Huilong Zhu 2009-07-14
7550323 Electrical fuse with a thinned fuselink middle portion William K. Henson, Deok-kee Kim, Chandrasekharan Kothandaraman 2009-06-23
7550364 Stress engineering using dual pad nitride with selective SOI device architecture William K. Henson, Kern Rim, William C. Wille 2009-06-23
7544577 Mobility enhancement in SiGe heterojunction bipolar transistors Thomas N. Adam 2009-06-09
7538391 Curved FINFETs Shreesh Narasimha, Edward J. Nowak, John J. Pekarik, Jeffrey W. Sleight, Richard Q. Williams 2009-05-26
7534667 Structure and method for fabrication of deep junction silicon-on-insulator transistors Brian J. Greene, John J. Ellis-Monaghan 2009-05-19