IA

Igor Matheus Petronella Aarts

AN Asml Holding N.V.: 10 patents #52 of 520Top 10%
AB Asml Netherlands B.V.: 6 patents #712 of 3,192Top 25%
📍 Port Chester, NY: #7 of 72 inventorsTop 10%
🗺 New York: #10,487 of 115,490 inventorsTop 10%
Overall (All Time): #337,394 of 4,157,543Top 9%
14
Patents All Time

Issued Patents All Time

Showing 1–14 of 14 patents

Patent #TitleCo-InventorsDate
12032299 Metrology method and associated metrology and lithographic apparatuses Patricius Aloysius Jacobus Tinnemans, Kaustuve Bhattacharyya, Ralph Brinkhof, Leendert Jan KARSSEMEIJER, Stefan Carolus Jacobus Antonius Keij +4 more 2024-07-09
11971665 Wafer alignment using form birefringence of targets or product Joshua Adams, Yuxiang Lin, Krishanu SHOME, Gerrit Johannes Nijmeijer 2024-04-30
11899380 Apparatus for and method of sensing alignment marks Krishanu SHOME, Junwon Lee 2024-02-13
11513446 Adaptive alignment Greger Andersson, Krishanu SHOME, Zahrasadat Dastouri 2022-11-29
11493852 Noise correction for alignment signal Zahrasadat Dastouri, Greger Andersson, Krishanu SHOME 2022-11-08
11175593 Alignment sensor apparatus for process sensitivity compensation Simon Reinald HUISMAN, Tamer Elazhary, Yuxiang Lin, Vu Quang TRAN, Sebastianus Adrianus GOORDEN +4 more 2021-11-16
11156928 Alignment mark for two-dimensional alignment in an alignment system Gerrit Johannes Nijmeijer, Junqiang Zhou, Piotr Jan Meyer, Jeffrey John Lombardo 2021-10-26
10928738 Adaptive filter for in-line correction Eric Brian Catey, Robert Anthony Augelli, Sergey MALYK 2021-02-23
10802208 Broad spectrum radiation by supercontinuum generation using a tapered optical fiber King Pui Leung, Tao Chen, Ronan James Havelin, Adel Joobeur, Joseph Carbone 2020-10-13
10488767 Alignment system wafer stack beam analyzer Krishanu SHOME, Justin Kreuzer, Irit Tzemah 2019-11-26
10481507 Measurement method comprising in-situ printing of apparatus mark and corresponding apparatus Kevin J. Violette, Haico Victor Kok, Eric Brian Catey 2019-11-19
8477289 Position measurement using natural frequency vibration of a pattern Daan Maurtis Slotboom, Johan Geerke 2013-07-02
8400617 Lithographic apparatus having a substrate support with open cell plastic foam parts Engelbertus Antonius Fransiscus Van Der Pasch, Dirk-Jan Bijvoet, Emiel Jozef Melanie Eussen 2013-03-19
8264671 Lithographic apparatus and device manufacturing method Engelbertus Antonius Fransiscus Van Der Pasch, Johan Geerke, Frederik Eduard De Jong, Marc Van De Grift 2012-09-11