TY

Tenko Yamashita

IBM: 492 patents #21 of 70,183Top 1%
Globalfoundries: 118 patents #11 of 4,424Top 1%
TE Tessera: 5 patents #92 of 271Top 35%
CEA: 4 patents #1,058 of 7,956Top 15%
SO Sony: 4 patents #8,966 of 25,231Top 40%
ET Elpis Technologies: 3 patents #8 of 121Top 7%
RE Renesas Electronics: 3 patents #1,322 of 4,529Top 30%
AS Adeia Semiconductor Solutions: 2 patents #9 of 57Top 20%
SS Stmicroelectronics Sa: 2 patents #601 of 1,676Top 40%
KT Kabushiki Kaisha Toshiba: 1 patents #13,537 of 21,451Top 65%
SF SUNY Research Foundation: 1 patents #469 of 1,165Top 45%
Samsung: 1 patents #49,284 of 75,807Top 70%
📍 Schenectady, NY: #2 of 1,353 inventorsTop 1%
🗺 New York: #20 of 115,490 inventorsTop 1%
Overall (All Time): #309 of 4,157,543Top 1%
552
Patents All Time

Issued Patents All Time

Showing 101–125 of 552 patents

Patent #TitleCo-InventorsDate
10600778 Method and apparatus of forming high voltage varactor and vertical transistor on a substrate Kangguo Cheng, Ruilong Xie, Chun-Chen Yeh 2020-03-24
10586854 Gate-all-around field effect transistor having multiple threshold voltages Ruqiang Bao, Michael A. Guillorn, Terence B. Hook, Robert R. Robison, Reinaldo Vega 2020-03-10
10586855 Spacer chamfering gate stack scheme Hyun-Jin Cho, Hui Zang 2020-03-10
10566443 Nanosheet transitor with optimized junction and cladding defectivity control Kangguo Cheng, Nicolas Loubet, Ruilong Xie, Chun-Chen Yeh 2020-02-18
10566438 Nanosheet transistor with dual inner airgap spacers Ruilong Xie, Kangguo Cheng, Chun-Chen Yeh 2020-02-18
10566442 Vertical field effect transistor with reduced parasitic capacitance Kangguo Cheng, Ruilong Xie, Chun-Chen Yeh 2020-02-18
10546776 Dual silicide liner flow for enabling low contact resistance Praneet Adusumilli, Veeraraghavan S. Basker, Zuoguang Liu, Chun-Chen Yeh 2020-01-28
10546942 Nanosheet transistor with optimized junction and cladding defectivity control Kangguo Cheng, Nicolas Loubet, Ruilong Xie, Chun-Chen Yeh 2020-01-28
10541318 Prevention of extension narrowing in nanosheet field effect transistors Chun Wing Yeung, Chen Zhang 2020-01-21
10535606 Dual metal-insulator-semiconductor contact structure and formulation method Takashi Ando, Hiroaki Niimi 2020-01-14
10510617 CMOS VFET contacts with trench solid and liquid phase epitaxy Oleg Gluschenkov, Zuoguang Liu, Shogo Mochizuki, Hiroaki Niimi 2019-12-17
10490653 Embedded bottom metal contact formed by a self-aligned contact process for vertical transistors Su Chen Fan, Zuoguang Liu, Heng Wu 2019-11-26
10468525 VFET CMOS dual epitaxy integration Kangguo Cheng, Ruilong Xie, Chun-Chen Yeh 2019-11-05
10453939 Reduced capacitance in vertical transistors by preventing excessive overlap between the gate and the source/drain Kangguo Cheng, Ruilong Xie, Chun-Chen Yeh 2019-10-22
10453922 Conformal doping for punch through stopper in fin field effect transistor devices Huiming Bu, Sivananda K. Kanakasabapathy, Fee Li Lie 2019-10-22
10439045 Flipped VFET with self-aligned junctions and controlled gate length Chen Zhang 2019-10-08
10439031 Integration of vertical-transport transistors and electrical fuses Ruilong Xie, Kangguo Cheng, Chun-Chen Yeh 2019-10-08
10418485 Forming a combination of long channel devices and vertical transport Fin field effect transistors on the same substrate Cheng Chi, Chen Zhang 2019-09-17
10418277 Air gap spacer formation for nano-scale semiconductor devices Kangguo Cheng, Thomas J. Haigh, Jr., Juntao Li, Eric G. Liniger, Sanjay C. Mehta +2 more 2019-09-17
10411127 Forming a combination of long channel devices and vertical transport fin field effect transistors on the same substrate Cheng Chi, Chen Zhang 2019-09-10
10396177 Prevention of extension narrowing in nanosheet field effect transistors Chun Wing Yeung, Chen Zhang 2019-08-27
10396183 Parasitic capacitance reducing contact structure in a finFET Miaomiao Wang, Chun-Chen Yeh, Hui Zang 2019-08-27
10396000 Test structure macro for monitoring dimensions of deep trench isolation regions and local trench isolation regions Chun-Chen Yeh, Hui Zang 2019-08-27
10396178 Method of forming improved vertical FET process with controlled gate length and self-aligned junctions Chen Zhang 2019-08-27
10396208 Vertical transistors with improved top source/drain junctions Kangguo Cheng, Muthumanickam Sankarapandian, Ruilong Xie, Chun-Chen Yeh 2019-08-27