OG

Oleg Gluschenkov

IBM: 242 patents #113 of 70,183Top 1%
Globalfoundries: 10 patents #365 of 4,424Top 9%
Infineon Technologies Ag: 7 patents #1,452 of 7,486Top 20%
UL Ultratech: 2 patents #39 of 110Top 40%
GU Globalfoundries U.S.: 1 patents #344 of 665Top 55%
📍 Tannersville, NY: #1 of 4 inventorsTop 25%
🗺 New York: #87 of 115,490 inventorsTop 1%
Overall (All Time): #1,894 of 4,157,543Top 1%
255
Patents All Time

Issued Patents All Time

Showing 201–225 of 255 patents

Patent #TitleCo-InventorsDate
7205207 High performance strained CMOS devices Bruce B. Doris 2007-04-17
7205206 Method of fabricating mobility enhanced CMOS devices Michael P. Belyansky, Bruce B. Doris 2007-04-17
7202516 CMOS transistor structure including film having reduced stress by exposure to atomic oxygen Michael P. Belyansky, Diane C. Boyd, Bruce B. Doris 2007-04-10
7198995 Strained finFETs and method of manufacture Dureseti Chidambarrao, Omer H. Dokumaci 2007-04-03
7176116 High performance FET with laterally thin extension Cyril Cabral, Jr., Omer H. Dokumaci 2007-02-13
7170126 Structure of vertical strained silicon devices Kangguo Cheng, Dureseti Chidambarrao, Rama Divakaruni 2007-01-30
7160771 Forming gate oxides having multiple thicknesses Anthony I. Chou, Michael P. Chudzik, Toshiharu Furukawa, Paul Kirsch, Byoung Hun Lee +4 more 2007-01-09
7144767 NFETs using gate induced stress modulation Dureseti Chidambarrao, Omer H. Dokumaci 2006-12-05
7138685 Vertical MOSFET SRAM cell Louis L. Hsu, Jack A. Mandelman, Carl Radens 2006-11-21
7122849 Stressed semiconductor device structures having granular semiconductor material Bruce B. Doris, Michael P. Belyansky, Diane C. Boyd, Dureseti Chidambarrao 2006-10-17
7119403 High performance strained CMOS devices Bruce B. Doris 2006-10-10
7084024 Gate electrode forming methods using conductive hard mask Dae-Gyu Park 2006-08-01
7030012 Method for manufacturing tungsten/polysilicon word line structure in vertical DRAM Ramachandra Divakaruni, Oh-Jung Kwon, Rajeev Malik 2006-04-18
7026247 Nanocircuit and self-correcting etching method for fabricating same Omer H. Dokumaci 2006-04-11
7023064 Temperature stable metal nitride gate electrode Dae-Gyu Park, Cyril Cabral, Jr., Hyungjun Kim 2006-04-04
7023041 Trench capacitor vertical structure Giuseppe La Rosa, Thomas W. Dyer, Jack A. Mandelman, Carl Radens, Alvin W. Strong 2006-04-04
7015082 High mobility CMOS circuits Bruce B. Doris, Huilong Zhu 2006-03-21
7002209 MOSFET structure with high mechanical stress in the channel Xiangdong Chen, Dureseti Chidambarrao, Brian J. Greene, Kern Rim, Haining Yang 2006-02-21
6989322 Method of forming ultra-thin silicidation-stop extensions in mosfet devices Cyril Cabral, Jr., Omer H. Dokumaci, Christian Lavoie 2006-01-24
6982196 Oxidation method for altering a film structure and CMOS transistor structure formed therewith Michael P. Belyansky, Diane C. Boyd, Bruce B. Doris 2006-01-03
6977194 Structure and method to improve channel mobility by gate electrode stress modification Michael P. Belyansky, Dureseti Chidambarrao, Omer H. Dokumaci, Bruce B. Doris 2005-12-20
6975133 Logic circuits having linear and cellular gate transistors Victor Wing Chung Chan, Hsing-Jen Wann, Shih-Fen Huang 2005-12-13
6974991 DRAM cell with buried collar and self-aligned buried strap Kangguo Cheng, Ramachandra Divkaruni, Gary B. Bronner, Carl Radens 2005-12-13
6960514 Pitcher-shaped active area for field effect transistor and method of forming same Jochen Beintner, Rama Divakaruni, Johnathan E. Faltermeier, Philip L. Flaitz, Carol J. Heenan +5 more 2005-11-01
6933577 High performance FET with laterally thin extension Cyril Cabral, Jr., Omer H. Dokumaci 2005-08-23