OG

Oleg Gluschenkov

IBM: 242 patents #113 of 70,183Top 1%
Globalfoundries: 10 patents #365 of 4,424Top 9%
Infineon Technologies Ag: 7 patents #1,452 of 7,486Top 20%
UL Ultratech: 2 patents #39 of 110Top 40%
GU Globalfoundries U.S.: 1 patents #344 of 665Top 55%
📍 Tannersville, NY: #1 of 4 inventorsTop 25%
🗺 New York: #87 of 115,490 inventorsTop 1%
Overall (All Time): #1,894 of 4,157,543Top 1%
255
Patents All Time

Issued Patents All Time

Showing 176–200 of 255 patents

Patent #TitleCo-InventorsDate
7504700 Method of forming an ultra-thin [[HfSiO]] metal silicate film for high performance CMOS applications and semiconductor structure formed in said method Wenjuan Zhu, Michael P. Chudzik, Dae-Gyu Park, Akihisa Sekiguchi 2009-03-17
7488658 Stressed semiconductor device structures having granular semiconductor material Bruce B. Doris, Michael P. Belyansky, Diane C. Boyd, Dureseti Chidambarrao 2009-02-10
7452761 Hybrid SOI-bulk semiconductor transistors Huilong Zhu, Philip J. Oldiges, Bruce B. Doris, Xinlin Wang, Huajie Chen +1 more 2008-11-18
7446004 Method for reducing overlap capacitance in field effect transistors Huilong Zhu 2008-11-04
7402870 Ultra shallow junction formation by epitaxial interface limited diffusion Huajie Chen, Omer H. Dokumaci, Werner Rausch 2008-07-22
7396714 Method of making strained semiconductor transistors having lattice-mismatched semiconductor regions underlying source and drain regions Huajie Chen, Dureseti Chidambarrao, An Steegen, Haining Yang 2008-07-08
7394273 On-chip electromigration monitoring system Louis L. Hsu, Hayden C. Cranford, Jr., James S. Mason, Michael A. Sorna, Chih-Chao Yang 2008-07-01
7388257 Multi-gate device with high k dielectric for channel top surface Bruce B. Doris, Ying Zhang, Huilong Zhu 2008-06-17
7354806 Semiconductor device structure with active regions having different surface directions and methods Bruce B. Doris, Meikei Ieong, Effendi Leobandung, Huilong Zhu 2008-04-08
7355245 Structure for reducing overlap capacitance in field effect transistors Huilong Zhu 2008-04-08
7342266 Field effect transistors with dielectric source drain halo regions and reduced miller capacitance Michael P. Belyansky, Dureseti Chidambarrao 2008-03-11
7312134 Dual stressed SOI substrates Dureseti Chidambarrao, Omer H. Dokumaci, Bruce B. Doris, Huilong Zhu 2007-12-25
7291528 Method of making strained semiconductor transistors having lattice-mismatched semiconductor regions underlying source and drain regions Huajie Chen, Dureseti Chidambarrao, An Steegen, Haining Yang 2007-11-06
7285480 Integrated circuit chip with FETs having mixed body thicknesses and method of manufacture thereof Rajiv V. Joshi, Louis C. Hsu 2007-10-23
7285826 High mobility CMOS circuits Bruce B. Doris, Huilong Zhu 2007-10-23
7282403 Temperature stable metal nitride gate electrode Dae-Gyu Park, Cyril Cabral, Jr., Hyungjun Kim 2007-10-16
7279413 High-temperature stable gate structure with metallic electrode Dae-Gyu Park, Michael A. Gribelyuk, Kwong Hon Wong 2007-10-09
7271049 Method of forming self-aligned low-k gate cap Jack A. Mandelman, Michael P. Belyansky, Bruce B. Doris 2007-09-18
7262087 Dual stressed SOI substrates Dureseti Chidambarrao, Bruce B. Doris, Omer H. Dokumaci, Huilong Zhu 2007-08-28
7253482 Structure for reducing overlap capacitance in field effect transistors Huilong Zhu 2007-08-07
7247547 Method of fabricating a field effect transistor having improved junctions Huilong Zhu, Chun-Yung Sung 2007-07-24
7247534 Silicon device on Si:C-OI and SGOI and method of manufacture Dureseti Chidambarrao, Omer H. Dokumaci 2007-07-24
7232774 Polycrystalline silicon layer with nano-grain structure and method of manufacture Ashima B. Chakravarti, Bruce B. Doris, Romany Ghali, Michael A. Gribelyuk, Woo-Hyeong Lee +1 more 2007-06-19
7230296 Self-aligned low-k gate cap Jack A. Mandelman, Michael P. Belyansky, Bruce B. Doris 2007-06-12
7223994 Strained Si on multiple materials for bulk or SOI substrates Dureseti Chidambarrao, Omer H. Dokumaci, Huilong Zhu 2007-05-29