KC

Kangguo Cheng

IBM: 324 patents #1 of 10,623Top 1%
Globalfoundries: 30 patents #3 of 961Top 1%
SS Stmicroelectronics Sa: 2 patents #28 of 127Top 25%
📍 Schenectady, NY: #1 of 124 inventorsTop 1%
🗺 New York: #1 of 11,825 inventorsTop 1%
Overall (2018): #1 of 503,207Top 1%
338
Patents 2018

Issued Patents 2018

Showing 101–125 of 338 patents

Patent #TitleCo-InventorsDate
10062615 Stacked nanowire devices Ramachandra Divakaruni, Juntao Li 2018-08-28
10062643 Nickel-silicon fuse for FinFET structures Keith E. Fogel, Pouya Hashemi, Alexander Reznicek 2018-08-28
10056482 Implementation of long-channel thick-oxide devices in vertical transistor flow Karthik Balakrishnan, Pouya Hashemi, Alexander Reznicek 2018-08-21
10056489 Replacement metal gate structures Veeraraghavan S. Basker, Theodorus E. Standaert, Junli Wang 2018-08-21
10056289 Fabrication of vertical transport fin field effect transistors with a self-aligned separator and an isolation region with an air gap Zuoguang Liu, Sebastian Naczas, Heng Wu, Peng Xu 2018-08-21
10056366 Gate stack integrated metal resistors Veeraraghavan S. Basker, Theodorus E. Standaert, Junli Wang 2018-08-21
10056254 Methods for removal of selected nanowires in stacked gate all around architecture Karthik Balakrishnan, Pouya Hashemi, Alexander Reznicek 2018-08-21
10056367 Gate stack integrated metal resistors Veeraraghavan S. Basker, Theodorus E. Standaert, Junli Wang 2018-08-21
10056474 Semiconductor structures having increased channel strain using fin release in gate regions Bruce B. Doris, Ali Khakifirooz, Darsen D. Lu, Alexander Reznicek, Kern Rim 2018-08-21
10056255 Method and structure for forming dielectric isolated FinFET with improved source/drain epitaxy Juntao Li 2018-08-21
10050107 Nanosheet transistors on bulk material Ruilong Xie, Tenko Yamashita, Chun-Chen Yeh 2018-08-14
10050121 Replacement metal gate structures Veeraraghavan S. Basker, Theodorus E. Standaert, Junli Wang 2018-08-14
10050141 Precise control of vertical transistor gate length Veeraraghavan S. Basker, Theodorus E. Standaert, Junli Wang 2018-08-14
10049945 Forming a CMOS with dual strained channels Pouya Hashemi, Ali Khakifirooz, Alexander Reznicek 2018-08-14
10043874 Uniform vertical field effect transistor spacers Juntao Li 2018-08-07
10043878 Vertical field-effect-transistors having multiple threshold voltages Karthik Balakrishnan, Pouya Hashemi, Alexander Reznicek 2018-08-07
10043900 Vertical transport Fin field effect transistors on a substrate with varying effective gate lengths Zhenxing Bi, Juntao Li, Peng Xu 2018-08-07
10043801 Air gap spacer for metal gates Marc A. Bergendahl, Fee Li Lie, Eric R. Miller, John R. Sporre, Sean Teehan 2018-08-07
10043746 Fabrication of vertical fuses from vertical fins James J. Demarest, Juntao Li 2018-08-07
10037916 Semiconductor fins for finFET devices and sidewall image transfer (SIT) processes for manufacturing the same Veeraraghavan S. Basker, Theodorus E. Standaert 2018-07-31
10037919 Integrated single-gated vertical field effect transistor (VFET) and independent double-gated VFET Ruilong Xie, Chun-Chen Yeh, Tenko Yamashita 2018-07-31
10038053 Methods for removal of selected nanowires in stacked gate all around architecture Karthik Balakrishnan, Pouya Hashemi, Alexander Reznicek 2018-07-31
10038066 Uniform vertical field effect transistor spacers Juntao Li 2018-07-31
10038075 Silicon-on-nothing transistor semiconductor structure with channel epitaxial silicon-germanium region Stephane Allegret-Maret, Bruce B. Doris, Prasanna Khare, Qing Liu, Nicolas Loubet 2018-07-31
10032912 Semiconductor integrated structure having an epitaxial SiGe layer extending from silicon-containing regions formed between segments of oxide regions Pierre Morin, Jody A. Fronheiser, Xiuyu Cai, Juntao Li, Shogo Mochizuki +3 more 2018-07-24