AK

Ali Khakifirooz

IBM: 60 patents #24 of 10,623Top 1%
Globalfoundries: 5 patents #67 of 961Top 7%
IN Intel: 1 patents #2,031 of 5,158Top 40%
📍 Brookline, MA: #1 of 455 inventorsTop 1%
🗺 Massachusetts: #3 of 12,682 inventorsTop 1%
Overall (2018): #124 of 503,207Top 1%
63
Patents 2018

Issued Patents 2018

Showing 1–25 of 63 patents

Patent #TitleCo-InventorsDate
10158001 Heterogeneous source drain region and extension region Kangguo Cheng, Pouya Hashemi, Alexander Reznicek 2018-12-18
10153157 P-FET with graded silicon-germanium channel Kangguo Cheng, Darsen D. Lu, Alexander Reznicek 2018-12-11
10147679 Electrical fuse and/or resistor structures Veeraraghavan S. Basker, Kangguo Cheng, Juntao Li 2018-12-04
10147804 High density vertical nanowire stack for field effect transistor Kangguo Cheng, Juntao Li 2018-12-04
10147602 Double aspect ratio trapping Kangguo Cheng, Bruce B. Doris, Alexander Reznicek 2018-12-04
10141428 Fin formation in fin field effect transistors Kangguo Cheng, Bruce B. Doris, Hong He, Yunpeng Yin 2018-11-27
10141461 Textured multi-junction solar cell and fabrication method Bahman Hekmatshoartabari, Ghavam G. Shahidi, Davood Shahrjerdi 2018-11-27
10109361 Coarse pass and fine pass multi-level NVM programming Pranav Kalavade, Rohit S. Shenoy, Aliasgar S. Madraswala, Donia Sebastian, Xin Guo 2018-10-23
10109709 P-FET with strained silicon-germanium channel Kangguo Cheng, Alexander Reznicek, Ghavam G. Shahidi 2018-10-23
10084050 Semiconductor device with low-K gate cap and self-aligned contact Kangguo Cheng, Alexander Reznicek, Charan V. Surisetty 2018-09-25
10084041 Method and structure for improving FinFET with epitaxy source/drain Kangguo Cheng, Alexander Reznicek, Tenko Yamashita 2018-09-25
10084090 Method and structure of stacked FinFET Kangguo Cheng, Pouya Hashemi, Alexander Reznicek 2018-09-25
10083907 Method and structure for forming on-chip anti-fuse with reduced breakdown voltage Kangguo Cheng, Pouya Hashemi, Alexander Reznicek 2018-09-25
10084067 FinFET with epitaxial source and drain regions and dielectric isolated channel region Kangguo Cheng, Ramachandra Divakaruni, Alexander Reznicek, Soon-Cheon Seo 2018-09-25
10083972 Hybrid logic and SRAM contacts Veeraraghavan S. Basker, Kangguo Cheng 2018-09-25
10079303 Method to form strained nFET and strained pFET nanowires on a same substrate Kangguo Cheng, Pouya Hashemi, Alexander Reznicek 2018-09-18
10079181 P-FET with strained silicon-germanium channel Kangguo Cheng, Alexander Reznicek, Ghavam G. Shahidi 2018-09-18
10056474 Semiconductor structures having increased channel strain using fin release in gate regions Kangguo Cheng, Bruce B. Doris, Darsen D. Lu, Alexander Reznicek, Kern Rim 2018-08-21
10049945 Forming a CMOS with dual strained channels Kangguo Cheng, Pouya Hashemi, Alexander Reznicek 2018-08-14
10050166 Silicon heterojunction photovoltaic device with wide band gap emitter Bahman Hekmatshoar-Tabari, Devendra K. Sadana, Ghavam G. Shahidi, Davood Shahrjerdi 2018-08-14
10032773 FinFET with reduced capacitance Veeraraghavan S. Basker, Kangguo Cheng, Charles W. Koburger, III 2018-07-24
10032884 Unmerged epitaxial process for FinFET devices with aggressive fin pitch scaling Xiuyu Cai, Kangguo Cheng, Ruilong Xie, Tenko Yamashita 2018-07-24
10020257 Electrical fuse and/or resistor structures Veeraraghavan S. Basker, Kangguo Cheng, Juntao Li 2018-07-10
10011920 Low-temperature selective epitaxial growth of silicon for device integration Bahman Hekmatshoar-Tabari, Alexander Reznicek, Devendra K. Sadana, Ghavam G. Shahidi, Davood Shahrjerdi 2018-07-03
10014322 Local SOI fins with multiple heights Kangguo Cheng, Joel P. de Souza, Alexander Reznicek, Dominic J. Schepis 2018-07-03