HH

Hsien-Pin Hu

TSMC: 83 patents #352 of 12,232Top 3%
📍 Zhubeikou, TW: #22 of 368 inventorsTop 6%
Overall (All Time): #20,908 of 4,157,543Top 1%
83
Patents All Time

Issued Patents All Time

Showing 51–75 of 83 patents

Patent #TitleCo-InventorsDate
9818720 Structure and formation method for chip package Wen-Hsin Wei, Chi-Hsi Wu, Chen-Hua Yu, Shang-Yun Hou, Wei-Ming Chen 2017-11-14
9806058 Chip package having die structures of different heights and method of forming same Wen-Hsin Wei, Chi-Hsi Wu, Chen-Hua Yu, Shang-Yun Hou, Wei-Ming Chen 2017-10-31
9741669 Forming large chips through stitching Wen-Hsin Wei, Shang-Yun Hou, Wei-Ming Chen 2017-08-22
9691840 Cylindrical embedded capacitors An-Jhih Su, Chi-Chun Hsieh, Tzu-Yu Wang, Wei-Cheng Wu, Shang-Yun Hou +2 more 2017-06-27
9653531 Methods of manufacturing a package Hsiao-Tsung Yen, Min-Chie Jeng, Tzuan-Horng Liu, Chin-Wei Kuo, Chung-Yu Lu +1 more 2017-05-16
9627223 Methods and apparatus of packaging with interposers Chung-Yu Lu, Hsiao-Tsung Yen, Tzuan-Horng Liu, Shih-Wen Huang, Shang-Yun Hou +1 more 2017-04-18
9618572 Testing of semiconductor chips with microbumps Wei-Cheng Wu, Shang-Yun Hou, Shin-Puu Jeng, Chen-Hua Yu, Chao-Hsiang Yang 2017-04-11
9589857 Interposer test structures and methods Tzuan-Horng Liu, Chen-Hua Yu, Tzu-Yu Wang, Wei-Cheng Wu, Shang-Yun Hou +1 more 2017-03-07
9530730 Configurable routing for packaging applications Chung-Yu Lu, Shin-Puu Jeng, Shang-Yun Hou, Tzuan-Horng Liu, Shih-Wen Huang +1 more 2016-12-27
9462692 Test structure and method of testing electrical characteristics of through vias Shang-Yun Hou, Wei-Cheng Wu, Jung Cheng Ko, Shin-Puu Jeng, Chen-Hua Yu +1 more 2016-10-04
9385079 Methods for forming stacked capacitors with fuse protection Shih-Cheng Chang, Liang-Chen Lin, Fu-Tsai Hou, Tung-Chin Yeh, Shih-Kai Lin +2 more 2016-07-05
9372206 Testing of semiconductor chips with microbumps Wei-Cheng Wu, Shang-Yun Hou, Shin-Puu Jeng, Chen-Hua Yu, Chao-Hsiang Yang 2016-06-21
9373673 3-D inductor and transformer Hsiao-Tsung Yen, Chin-Wei Kuo, Sally Liu, Ming-Fa Chen, Jhe-Ching Lu 2016-06-21
9305808 Methods and apparatus of packaging with interposers Chung-Yu Lu, Hsiao-Tsung Yen, Tzuan-Horng Liu, Shih-Wen Huang, Shang-Yun Hou +1 more 2016-04-05
9299649 3D packages and methods for forming the same Tzu-Wei Chiu, Cheng-Hsien Hsieh, Kuo-Ching Hsu, Shang-Yun Hou, Shin-Puu Jeng 2016-03-29
9128123 Interposer test structures and methods Tzuan-Horng Liu, Chen-Hua Yu, Tzu-Yu Wang, Wei-Cheng Wu, Shang-Yun Hou +1 more 2015-09-08
9116203 Testing of semiconductor chips with microbumps Wei-Cheng Wu, Shang-Yun Hou, Shin-Puu Jeng, Chen-Hua Yu, Chao-Hsiang Yang 2015-08-25
9064705 Methods and apparatus of packaging with interposers Chung-Yu Lu, Hsiao-Tsung Yen, Tzuan-Horng Liu, Shih-Wen Huang, Shang-Yun Hou +1 more 2015-06-23
9059026 3-D inductor and transformer Hsiao-Tsung Yen, Chin-Wei Kuo, Sally Liu, Ming-Fa Chen, Jhe-Ching Lu 2015-06-16
8993432 Test structure and method of testing electrical characteristics of through vias Shang-Yun Hou, Wei-Cheng Wu, Jung Cheng Ko, Shin-Puu Jeng, Chen-Hua Yu +1 more 2015-03-31
8896089 Interposers for semiconductor devices and methods of manufacture thereof Tzu-Wei Chiu, Tzu-Yu Wang, Wei-Cheng Wu, Chun-Yi Liu, Shang-Yun Hou 2014-11-25
8896094 Methods and apparatus for inductors and transformers in packages Hsiao-Tsung Yen, Yu-Ling Lin, Chung-Yu Lu, Chin-Wei Kuo, Tzuan-Horng Liu +1 more 2014-11-25
8878182 Probe pad design for 3DIC package yield analysis Tzu-Yu Wang, Chen-Hua Yu, Shin-Puu Jeng, Shang-Yun Hou, Wei-Cheng Wu +2 more 2014-11-04
8872345 Forming grounded through-silicon vias in a semiconductor substrate Chi-Chun Hsieh, Wei-Cheng Wu, Hsiao-Tsung Yen, Shang-Yun Hou, Shin-Puu Jeng 2014-10-28
8797057 Testing of semiconductor chips with microbumps Wei-Cheng Wu, Shang-Yun Hou, Shin-Puu Jeng, Chen-Hua Yu, Chao-Hsiang Yang 2014-08-05