Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10054938 | Clustering for prediction models in process control and for optimal dispatching | Tzu-Yu Wang, Kewei Zuo, Kuan Teng Lo, Chien Rhone Wang, Chih-Wei Lai | 2018-08-21 |
| 9588505 | Near non-adaptive virtual metrology and chamber control | Tzu-Yu Wang, Chen-Hua Yu, Chien Rhone Wang, Henry Lo, Chih-Wei Lai +1 more | 2017-03-07 |
| 9462692 | Test structure and method of testing electrical characteristics of through vias | Shang-Yun Hou, Wei-Cheng Wu, Hsien-Pin Hu, Shin-Puu Jeng, Chen-Hua Yu +1 more | 2016-10-04 |
| 9159673 | Forming interconnect structures using pre-ink-printed sheets | Chi-Chun Hsieh, Shang-Yun Hou, Wen-Chih Chiou, Shin-Puu Jeng, Chen-Hua Yu | 2015-10-13 |
| 8993432 | Test structure and method of testing electrical characteristics of through vias | Shang-Yun Hou, Wei-Cheng Wu, Hsien-Pin Hu, Shin-Puu Jeng, Chen-Hua Yu +1 more | 2015-03-31 |