Issued Patents All Time
Showing 51–75 of 105 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8765496 | Methods and systems for measuring a characteristic of a substrate or preparing a substrate for analysis | Mehran Nasser-Ghodsi, Mark Borowicz, Dave Bakker, Prashant Aji, Rudy F. Garcia +1 more | 2014-07-01 |
| 8436554 | LED solar illuminator | Guoheng Zhao, Ady Levy, Alex Salnik, Lena Nicolaides, Samuel Ngai | 2013-05-07 |
| 8283631 | In-situ differential spectroscopy | Mehran Nasser-Ghodsi, Guoheng Zhao | 2012-10-09 |
| 8194301 | Multi-spot scanning system and method | Guoheng Zhao, Rex Runyon | 2012-06-05 |
| 8194240 | Enhanced focusing capability on a sample using a spot matrix | Stan Stokowski, Guoheng Zhao | 2012-06-05 |
| 7989729 | Detecting and repairing defects of photovoltaic devices | Guoheng Zhao, George H. Zapalac, Jr., Samuel Ngai, Ady Levy | 2011-08-02 |
| 7978323 | Surface inspection system with improved capabilities | Lawrence R. Miller | 2011-07-12 |
| 7869023 | System for detecting anomalies and/or features of a surface | Guoheng Zhao, Stanley Stokowski | 2011-01-11 |
| 7782452 | Systems and method for simultaneously inspecting a specimen with two distinct channels | Courosh Mehanian, Hans J. Hansen, Yingjian Wang, Yuval Ben-Dov, Zheng Li +2 more | 2010-08-24 |
| 7746459 | Systems configured to inspect a wafer | Azmi Kadkly, Stephen Biellak | 2010-06-29 |
| 7733111 | Segmented optical and electrical testing for photovoltaic devices | Guoheng Zhao, Bin-Ming Benjamin Tsai, Ady Levy, George H. Zapalac, Jr., Samuel Ngai | 2010-06-08 |
| 7709794 | Defect detection using time delay lock-in thermography (LIT) and dark field LIT | Guoheng Zhao, Geordie Zapalac, Samuel Ngai, Ady Levy, Vineet Dharmadhikari | 2010-05-04 |
| 7679735 | Optical system for detecting anomalies and/or features of surfaces | Isabella Talley Lewis | 2010-03-16 |
| 7623229 | Systems and methods for inspecting wafers | Stephen Biellak | 2009-11-24 |
| 7607647 | Stabilizing a substrate using a vacuum preload air bearing chuck | Guoheng Zhao, Alexander Belyaev, Christian Wolters, Paul Doyle, Howard Dando | 2009-10-27 |
| 7525649 | Surface inspection system using laser line illumination with two dimensional imaging | Jenn-Kuen Leong, Guoheng Zhao | 2009-04-28 |
| 7492451 | Simultaneous multi-spot inspection and imaging | Lawrence R. Miller | 2009-02-17 |
| 7471382 | Surface inspection system with improved capabilities | Lawrence R. Miller | 2008-12-30 |
| 7385688 | Multi-spot illumination and collection optics for highly tilted wafer planes | Azmi Kadkly | 2008-06-10 |
| 7365834 | Optical system for detecting anomalies and/or features of surfaces | Isabella Talley Lewis | 2008-04-29 |
| 7345752 | Multi-spot illumination and collection optics for highly tilted wafer planes | Azmi Kadkly | 2008-03-18 |
| 7345754 | Fourier filters and wafer inspection systems | Guoheng Zhao, Andrew V. Hill, Avijit K. Ray-Chaudhuri | 2008-03-18 |
| 7319229 | Illumination apparatus and methods | Guoheng Zhao, Stanley Stokowski | 2008-01-15 |
| 7315022 | High-speed electron beam inspection | David L. Adler, Mark A. McCord, Liqun Han, Kirk J. Bertsche | 2008-01-01 |
| 7295303 | Methods and apparatus for inspecting a sample | Guoheng Zhao | 2007-11-13 |