Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8765496 | Methods and systems for measuring a characteristic of a substrate or preparing a substrate for analysis | Mehran Nasser-Ghodsi, Mark Borowicz, Mehdi Vaez-Iravani, Prashant Aji, Rudy F. Garcia +1 more | 2014-07-01 |
| 8045145 | Systems and methods for acquiring information about a defect on a specimen | Gabor Toth, Varoujan Chakarian | 2011-10-25 |