Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7782452 | Systems and method for simultaneously inspecting a specimen with two distinct channels | Courosh Mehanian, Yingjian Wang, Yuval Ben-Dov, Zheng Li, Andrew V. Hill +2 more | 2010-08-24 |
| 7663746 | Method and apparatus for scanning, stitching and damping measurements of a double sided metrology inspection tool | Paul Sullivan, Geroge Kren, Rodney Smedt, David W. Shortt, Daniel Kavaldjiev +1 more | 2010-02-16 |
| 7436506 | Method and apparatus for scanning, stitching, and damping measurements of a double-sided metrology inspection tool | Paul Sullivan, George Kren, Rodney Smedt, David W. Shortt, Daniel Kavaldjiev +1 more | 2008-10-14 |
| 7009696 | Method and apparatus for scanning, stitching, and damping measurements of a double-sided metrology inspection tool | Paul Sullivan, George Kren, Rodney Smedt, David W. Shortt, Daniel Kavaldjiev +1 more | 2006-03-07 |
| 6924082 | Double-bond shifts of substituted (4n)-annulenes for information storage and data processing | — | 2005-08-02 |
| 6686996 | Method and apparatus for scanning, stitching, and damping measurements of a double-sided metrology inspection tool | Paul Sullivan, George Kren, Rodney Smedt, David W. Shortt, Daniel Kavaldjiev +1 more | 2004-02-03 |
| 6414752 | Method and apparatus for scanning, stitching, and damping measurements of a double-sided metrology inspection tool | Paul Sullivan, George Kren, Rodney Smedt, David W. Shortt, Daniel Kavaldjiev +1 more | 2002-07-02 |
| 5963314 | Laser imaging system for inspection and analysis of sub-micron particles | Bruce W. Worster, Dale E. Crane, Christopher R. Fairley, Ken Kinsun Lee | 1999-10-05 |
| 5504630 | Beam steering apparatus | — | 1996-04-02 |
| 5479252 | Laser imaging system for inspection and analysis of sub-micron particles | Bruce W. Worster, Dale E. Crane, Christopher R. Fairley, Ken Kinsun Lee | 1995-12-26 |