Issued Patents All Time
Showing 76–100 of 105 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7280199 | System for detecting anomalies and/or features of a surface | Guoheng Zhao, Stanley Stokowski | 2007-10-09 |
| 7218392 | Systems and methods for a wafer inspection system using multiple angles and multiple wavelength illumination | Steve Biellak, Stanley Stokowski | 2007-05-15 |
| 7130039 | Simultaneous multi-spot inspection and imaging | Lawrence R. Miller | 2006-10-31 |
| 7119897 | Sample inspection system | Stanley Stokowski, Guoheng Zhao | 2006-10-10 |
| 7116413 | Inspection system for integrated applications | — | 2006-10-03 |
| 7088443 | System for detecting anomalies and/or features of a surface | Guoheng Zhao, Stanley Stokowski | 2006-08-08 |
| 7079238 | Sample inspection system | Stanley Stokowski, Guoheng Zhao | 2006-07-18 |
| 7068363 | Systems for inspection of patterned or unpatterned wafers and other specimen | Christopher F. Bevis, Mike Kirk | 2006-06-27 |
| 7064821 | Sample inspection system | Stanley Stokowski, Guoheng Zhao | 2006-06-20 |
| 6956644 | Systems and methods for a wafer inspection system using multiple angles and multiple wavelength illumination | Steve Biellak, Stanley Stokowski | 2005-10-18 |
| 6922236 | Systems and methods for simultaneous or sequential multi-perspective specimen defect inspection | Stan Stokowski, Steven Biellak, Jamie M. Sullivan, Keith Wells, Mehrdad Nikoonahad | 2005-07-26 |
| 6891611 | Sample inspection system | Stanley Stokowski, Guoheng Zhao | 2005-05-10 |
| 6862096 | Defect detection system | Jeffrey Rzepiela, Carl Treadwell, Andrew Zeng, Robert W. Fiordalice | 2005-03-01 |
| 6781688 | Process for identifying defects in a substrate having non-uniform surface properties | George Kren, David W. Shortt | 2004-08-24 |
| 6724473 | Method and system using exposure control to inspect a surface | Jenn-Kuen Leong, Guoheng Zhao | 2004-04-20 |
| 6710876 | Metrology system using optical phase | Mehrdad Nikoonahad, Guoheng Zhao, Ian Smith | 2004-03-23 |
| 6657715 | Sample inspection system | Stanley Stokowski, Guoheng Zhao | 2003-12-02 |
| 6639662 | Sample inspection system | Stanley Stokowski, Guoheng Zhao | 2003-10-28 |
| 6618134 | Sample inspection system | Stanley Stokowski, Guoheng Zhao | 2003-09-09 |
| 6608676 | System for detecting anomalies and/or features of a surface | Guoheng Zhao, Stanley Stokowski | 2003-08-19 |
| 6578961 | Massively parallel inspection and imaging system | — | 2003-06-17 |
| 6538730 | Defect detection system | Jeffrey Rzepiela, Carl Treadwell, Andrew Zeng, Robert W. Fiordalice | 2003-03-25 |
| 6384910 | Sample inspection system | Stanley Stokowski, Guoheng Zhao | 2002-05-07 |
| 6208411 | Massively parallel inspection and imaging system | — | 2001-03-27 |
| 6201601 | Sample inspection system | Stanley Stokowski, Guoheng Zhao | 2001-03-13 |