Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7218392 | Systems and methods for a wafer inspection system using multiple angles and multiple wavelength illumination | Stanley Stokowski, Mehdi Vaez-Iravani | 2007-05-15 |
| 6956644 | Systems and methods for a wafer inspection system using multiple angles and multiple wavelength illumination | Stanley Stokowski, Mehdi Vaez-Iravani | 2005-10-18 |
| 6577389 | System and methods for inspection of transparent mask substrates | Noah Bareket, Stanley Stokowski | 2003-06-10 |