Issued Patents All Time
Showing 1–18 of 18 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7933016 | Apparatus and methods for detecting overlay errors using scatterometry | Walter D. Mieher, Ady Levy, Boris Golovanevsky, Michael Friedmann, Michael Adel +10 more | 2011-04-26 |
| 7876440 | Apparatus and methods for detecting overlay errors using scatterometry | Walter D. Mieher, Ady Levy, Boris Golovanesky, Michael Friedmann, Michael Adel +1 more | 2011-01-25 |
| 7663753 | Apparatus and methods for detecting overlay errors using scatterometry | Walter D. Mieher, Ady Levy, Boris Golovanevsky, Michael Friedmann, Michael Adel +10 more | 2010-02-16 |
| 7659126 | Electrical test method and apparatus | Christopher F. Bevis | 2010-02-09 |
| 7564557 | Apparatus and methods for detecting overlay errors using scatterometry | Walter D. Mieher, Ady Levy, Boris Golovanesky, Michael Friedmann, Michael Adel +1 more | 2009-07-21 |
| 7433040 | Apparatus and methods for detecting overlay errors using scatterometry | Walter D. Mieher, Ady Levy, Boris Golovanesky, Michael Friedmann, Michael Adel +3 more | 2008-10-07 |
| 7385699 | Apparatus and methods for detecting overlay errors using scatterometry | Walter D. Mieher, Ady Levy, Boris Golovanesky, Michael Friedmann, Michael Adel +3 more | 2008-06-10 |
| 7379183 | Apparatus and methods for detecting overlay errors using scatterometry | Walter D. Mieher, Ady Levy, Boris Golovanesky, Michael Friedmann, Michael Adel +6 more | 2008-05-27 |
| 7361941 | Calibration standards and methods | Gian Francesco Lorusso, Christopher F. Bevis, Luca Grella, David L. Adler | 2008-04-22 |
| 7317531 | Apparatus and methods for detecting overlay errors using scatterometry | Walter D. Mieher, Ady Levy, Boris Golovanesky, Michael Friedmann, Michael Adel +10 more | 2008-01-08 |
| 7301634 | Apparatus and methods for detecting overlay errors using scatterometry | Walter D. Mieher, Ady Levy, Boris Golovanesky, Michael Friedmann, Michael Adel +7 more | 2007-11-27 |
| 7298481 | Apparatus and methods for detecting overlay errors using scatterometry | Walter D. Mieher, Ady Levy, Boris Golovanevsky, Michael Friedmann, Michael Adel +4 more | 2007-11-20 |
| 7289213 | Apparatus and methods for detecting overlay errors using scatterometry | Walter D. Mieher, Ady Levy, Boris Golovanesky, Michael Friedmann, Michael Adel +1 more | 2007-10-30 |
| 7280212 | Apparatus and methods for detecting overlay errors using scatterometry | Walter D. Mieher, Ady Levy, Boris Golovanesky, Michael Friedmann, Michael Adel +3 more | 2007-10-09 |
| 7242477 | Apparatus and methods for detecting overlay errors using scatterometry | Walter D. Mieher, Ady Levy, Boris Golovanesky, Michael Friedmann, Michael Adel +4 more | 2007-07-10 |
| 6999614 | Power assisted automatic supervised classifier creation tool for semiconductor defects | David Bakker, Saibal Banerjee | 2006-02-14 |
| 6710876 | Metrology system using optical phase | Mehrdad Nikoonahad, Guoheng Zhao, Mehdi Vaez-Iravani | 2004-03-23 |
| 5974351 | Multiplexed electronic control systems | Andrew Croft, Ian KENDALL | 1999-10-26 |