Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7709794 | Defect detection using time delay lock-in thermography (LIT) and dark field LIT | Guoheng Zhao, Geordie Zapalac, Samuel Ngai, Mehdi Vaez-Iravani, Ady Levy | 2010-05-04 |
| 4929923 | Thin film resistors and method of trimming | — | 1990-05-29 |