Issued Patents All Time
Showing 451–475 of 605 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9472643 | Method to improve reliability of replacement gate device | Eduard A. Cartier, Kisik Choi, Vijay Narayanan | 2016-10-18 |
| 9472408 | Nitridation on HDP oxide before high-k deposition to prevent oxygen ingress | Veeraraghavan S. Basker, Johnathan E. Faltermeier, Hemanth Jagannathan, Tenko Yamashita | 2016-10-18 |
| 9466492 | Method of lateral oxidation of NFET and PFET high-K gate stacks | Robert H. Dennard, Martin M. Frank | 2016-10-11 |
| 9466692 | Method to improve reliability of replacement gate device | Eduard A. Cartier, Kisik Choi, Vijay Narayanan | 2016-10-11 |
| 9455203 | Low threshold voltage CMOS device | Changhwan Choi, Kisik Choi, Vijay Narayanan | 2016-09-27 |
| 9449887 | Method of forming replacement gate PFET having TiALCO layer for improved NBTI performance | Balaji Kannan, Vijay Narayanan | 2016-09-20 |
| 9443953 | Sacrificial silicon germanium channel for inversion oxide thickness scaling with mitigated work function roll-off and improved negative bias temperature instability | Eduard A. Cartier, Kevin K. Chan, Vijay Narayanan | 2016-09-13 |
| 9425279 | Semiconductor device including high-K metal gate having reduced threshold voltage variation | David J. Frank | 2016-08-23 |
| 9412596 | Nitridation on HDP oxide before high-k deposition to prevent oxygen ingress | Veeraraghavan S. Basker, Johnathan E. Faltermeier, Hemanth Jagannathan, Tenko Yamashita | 2016-08-09 |
| 9391164 | Method to improve reliability of replacement gate device | Eduard A. Cartier, Kisik Choi, Vijay Narayanan | 2016-07-12 |
| 9382069 | Fixing device and image forming apparatus | — | 2016-07-05 |
| 9373501 | Hydroxyl group termination for nucleation of a dielectric metallic oxide | Michael P. Chudzik, Min Dai, Martin M. Frank, David F. Hilscher, Rishikesh Krishnan +3 more | 2016-06-21 |
| 9368536 | Solid state imaging device for reducing dark current, method of manufacturing the same, and imaging apparatus | Itaru Oshiyama, Susumu Hiyama, Tetsuji Yamaguchi, Yuko Ohgishi, Harumi Ikeda | 2016-06-14 |
| 9362282 | High-K gate dielectric and metal gate conductor stack for planar field effect transistors formed on type III-V semiconductor material and silicon germanium semiconductor material | Martin M. Frank, Pranita Kerber, Vijay Narayanan | 2016-06-07 |
| 9349832 | Sacrificial silicon germanium channel for inversion oxide thickness scaling with mitigated work function roll-off and improved negative bias temperature instability | Eduard A. Cartier, Kevin K. Chan, Vijay Narayanan | 2016-05-24 |
| 9330938 | Method of patterning dopant films in high-k dielectrics in a soft mask integration scheme | Hemanth Jagannathan, Balaji Kannan, Siddarth A. Krishnan, Unoh Kwon, Rekha Rajaram | 2016-05-03 |
| 9312136 | Replacement metal gate stack for diffusion prevention | Johnathan E. Faltermeier, Su Chen Fan, Sivananda K. Kanakasabapathy, Injo Ok, Tenko Yamashita | 2016-04-12 |
| 9299802 | Method to improve reliability of high-K metal gate stacks | Eduard A. Cartier, Barry P. Linder, Vijay Narayanan | 2016-03-29 |
| 9263344 | Low threshold voltage CMOS device | Changhwan Choi, Kisik Choi, Vijay Narayanan | 2016-02-16 |
| 9252229 | Inversion thickness reduction in high-k gate stacks formed by replacement gate processes | Vijay Narayanan | 2016-02-02 |
| 9105745 | Fabrication of low threshold voltage and inversion oxide thickness scaling for a high-k metal gate p-type MOSFET | Changhwan Choi, Martin M. Frank, Unoh Kwon, Vijay Narayanan | 2015-08-11 |
| 9099393 | Enabling enhanced reliability and mobility for replacement gate planar and FinFET structures | Eduard A. Cartier, Kisik Choi, Wing L. Lai, Vijay Narayanan, Ravikumar Ramachandran | 2015-08-04 |
| 9077903 | Imaging device including a blur correcting mechanism for reducing the radial load on movable connectors | Koichi Muramatsu | 2015-07-07 |
| 9059315 | Concurrently forming nFET and pFET gate dielectric layers | MaryJane Brodsky, Michael P. Chudzik, Min Dai, Siddarth A. Krishnan, Joseph F. Shepard, Jr. +2 more | 2015-06-16 |
| 9059314 | Structure and method to obtain EOT scaled dielectric stacks | Hemanth Jagannathan, Lisa F. Edge, Sufi Zafar, Changhwan Choi, Paul C. Jamison +2 more | 2015-06-16 |