Issued Patents All Time
Showing 501–525 of 605 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8740506 | Positioning apparatus | Shogo Ogaki, Masaru Inoue, Takeshi Shimoda | 2014-06-03 |
| 8733184 | Position testing apparatus | Shogo Ogaki | 2014-05-27 |
| 8736043 | Power device having a specific range of distances between collector and emitter electrodes | Akitoyo Konno, Katsunori Azuma | 2014-05-27 |
| 8735996 | Scavenging metal stack for a high-K gate dielectric | Unoh Kwon, Vijay Narayanan, James K. Schaeffer | 2014-05-27 |
| 8716088 | Scavenging metal stack for a high-K gate dielectric | Unoh Kwon, Vijay Narayanan, James K. Schaeffer | 2014-05-06 |
| 8716813 | Scaled equivalent oxide thickness for field effect transistor devices | Changhwan Choi, Unoh Kwon, Vijay Narayanan | 2014-05-06 |
| 8716118 | Replacement gate structure for transistor with a high-K gate stack | Eduard A. Cartier, Unoh Kwon, Vijay Narayanan | 2014-05-06 |
| 8708877 | Drum rotating device | Takeshi Kirihara, Isao Miki, Yoshikazu Mitsusada | 2014-04-29 |
| 8680629 | Control of flatband voltages and threshold voltages in high-k metal gate stacks and structures for CMOS devices | Hemanth Jagannathan, Vijay Narayanan | 2014-03-25 |
| 8662009 | Adhesive application apparatus | Eijiro Furuta, Akira Honma | 2014-03-04 |
| 8659077 | Multi-layer work function metal replacement gate | Aritra Dasgupta, Unoh Kwon, Sean M. Polvino | 2014-02-25 |
| 8647972 | Multi-layer work function metal replacement gate | Aritra Dasgupta, Unoh Kwon, Sean M. Polvino | 2014-02-11 |
| 8637930 | FinFET parasitic capacitance reduction using air gap | Josephine B. Chang, Sivananda K. Kanakasabapathy, Pranita Kulkarni, Theodorus E. Standaert, Tenko Yamashita | 2014-01-28 |
| 8637384 | FinFET parasitic capacitance reduction using air gap | Josephine B. Chang, Sivananda K. Kanakasabapathy, Pranita Kulkarni, Theodorus E. Standaert, Tenko Yamashita | 2014-01-28 |
| 8592296 | Gate-last fabrication of quarter-gap MGHK FET | Kisik Choi, Vijay Narayanan, Tenko Yamashita, Junli Wang | 2013-11-26 |
| 8592264 | Source-drain extension formation in replacement metal gate transistor device | Huiming Bu, Ramachandra Divakaruni, Bruce B. Doris, Chung-Hsun Lin, Huiling Shang +1 more | 2013-11-26 |
| 8583018 | Fusing device and image forming apparatus using the same | — | 2013-11-12 |
| 8581351 | Replacement gate with reduced gate leakage current | Michael P. Chudzik, Rishikesh Krishnan, Siddarth A. Krishnan, Unoh Kwon, Keith Kwong Hon Wong | 2013-11-12 |
| 8564066 | Interface-free metal gate stack | Kisik Choi, Matthew W. Copel, Richard A. Haight | 2013-10-22 |
| 8525552 | Semiconductor integrated circuit device having a plurality of standard cells for leakage current suppression | Keiichi Kusumoto, Kenji Shimazaki, Kazuyuki Nakanishi, Tetsurou Toubou | 2013-09-03 |
| 8507383 | Fabrication of replacement metal gate devices | Leslie M. Charns, Jason E. Cummings, Lukasz J. Hupka, Dinesh R. Koli, Tomohisa Konno +6 more | 2013-08-13 |
| 8492804 | Solid-state imaging device, method for producing same, and camera | Tetsuji Yamaguchi, Yasushi Maruyama, Susumu Hiyama, Yuko Ohgishi | 2013-07-23 |
| 8491291 | Pattern transfer method and imprint device | Susumu Komoriya, Masahiko Ogino, Akihiro Miyauchi | 2013-07-23 |
| 8486748 | Method for manufacturing solid-state imaging device | Harumi Ikeda, Susumu Hiyama, Kiyotaka Tabuchi, Tetsuji Yamaguchi, Yuko Ohgishi | 2013-07-16 |
| 8471347 | Solid-state imaging device capable of suppressing generation of dark current and imaging apparatus | Itaru Oshiyama, Susumu Hiyama, Tetsuji Yamaguchi, Yuko Ohgishi, Harumi Ikeda | 2013-06-25 |