| 12210663 |
Decommissioning and erasing entropy in microelectronic systems |
Swarup Bhunia, Md Moshiur Rahman, Abdulrahman Alaql |
2025-01-28 |
| 11838287 |
Enabling a mode of interaction to support specially-abled needs of agents, via a web app in a contact center |
— |
2023-12-05 |
| 11720654 |
Timed unlocking and locking of hardware intellectual properties |
Swarup Bhunia, Abdulrahman Alaql, Md Moshiur Rahman |
2023-08-08 |
| 11201061 |
Multiple nanosecond laser pulse anneal processes and resultant semiconductor structure |
Oleg Gluschenkov |
2021-12-14 |
| 10553439 |
Multiple nanosecond laser pulse anneal processes and resultant semiconductor structure |
Oleg Gluschenkov |
2020-02-04 |
| 10361132 |
Structures with thinned dielectric material |
Ruqiang Bao, Takashi Ando, Kai Zhao, Unoh Kwon, Siddarth A. Krishnan |
2019-07-23 |
| 10263065 |
Metal resistor forming method using ion implantation |
Domingo A. Ferrer Luppi, Benjamin G. Moser |
2019-04-16 |
| 10062618 |
Method and structure for formation of replacement metal gate field effect transistors |
Takashi Ando, Balaji Kannan, Unoh Kwon |
2018-08-28 |
| 9997361 |
Gate stack formed with interrupted deposition processes and laser annealing |
Takashi Ando, Oleg Gluschenkov, Balaji Kannan, Unoh Kwon |
2018-06-12 |
| 9997610 |
Gate stack formed with interrupted deposition processes and laser annealing |
Takashi Ando, Oleg Gluschenkov, Balaji Kannan, Unoh Kwon |
2018-06-12 |
| 9911597 |
Trench metal insulator metal capacitor with oxygen gettering layer |
Takashi Ando, Eduard A. Cartier, Michael P. Chudzik, Herbert L. Ho, Donghun Kang +3 more |
2018-03-06 |
| 9859121 |
Multiple nanosecond laser pulse anneal processes and resultant semiconductor structure |
Oleg Gluschenkov |
2018-01-02 |
| 9748235 |
Gate stack for integrated circuit structure and method of forming same |
Benjamin G. Moser, Mohammad Hasanuzzaman, Murshed Chowdhury, Shahrukh Khan, Shafaat Ahmed +1 more |
2017-08-29 |
| 9653534 |
Trench metal-insulator-metal capacitor with oxygen gettering layer |
Takashi Ando, Eduard A. Cartier, Michael P. Chudzik, Herbert L. Ho, Donghun Kang +3 more |
2017-05-16 |
| 9613866 |
Gate stack formed with interrupted deposition processes and laser annealing |
Takashi Ando, Oleg Gluschenkov, Balaji Kannan, Unoh Kwon |
2017-04-04 |
| 9613870 |
Gate stack formed with interrupted deposition processes and laser annealing |
Takashi Ando, Oleg Gluschenkov, Balaji Kannan, Unoh Kwon |
2017-04-04 |
| 9431485 |
Formation of finFET junction |
Shafaat Ahmed, Murshed Chowdhury, Mohammad Hasanuzzaman, Shahrukh Khan, Joyeeta Nag |
2016-08-30 |
| 8659077 |
Multi-layer work function metal replacement gate |
Takashi Ando, Unoh Kwon, Sean M. Polvino |
2014-02-25 |
| 8647972 |
Multi-layer work function metal replacement gate |
Takashi Ando, Unoh Kwon, Sean M. Polvino |
2014-02-11 |
