Issued Patents All Time
Showing 26–50 of 89 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9059251 | Microelectronic structure including air gap | Daniel C. Edelstein, David V. Horak, Elbert E. Huang, Takeshi Nogami, Shom Ponoth +1 more | 2015-06-16 |
| 9054160 | Interconnect structure and method for fabricating on-chip interconnect structures by image reversal | Robert L. Bruce, Qinghuang Lin, Alshakim Nelson, Dirk Pfeiffer, Jitendra S. Rathore | 2015-06-09 |
| 9018767 | Interlevel dielectric stack for interconnect structures | Griselda Bonilla, Alfred Grill, Thomas J. Haigh, Jr., Son V. Nguyen | 2015-04-28 |
| 8952539 | Methods for fabrication of an air gap-containing interconnect structure | Lawrence A. Clevenger, Maxime Darnon, Anthony D. Lisi, Qinghuang Lin | 2015-02-10 |
| 8896120 | Structures and methods for air gap integration | Lawrence A. Clevenger, Maxime Darnon, Qinghuang Lin, Anthony D. Lisi | 2014-11-25 |
| 8809183 | Interconnect structure with a planar interface between a selective conductive cap and a dielectric cap layer | Griselda Bonilla, Lawrence A. Clevenger, Elbert E. Huang, Shom Ponoth | 2014-08-19 |
| 8779600 | Interlevel dielectric stack for interconnect structures | Son V. Nguyen, Griselda Bonilla, Alfred Grill, Thomas J. Haigh, Jr. | 2014-07-15 |
| 8642252 | Methods for fabrication of an air gap-containing interconnect structure | Lawrence A. Clevenger, Maxime Darnon, Anthony D. Lisi, Qinghuang Lin | 2014-02-04 |
| 8629561 | Air gap-containing interconnect structure having photo-patternable low k material | Lawrence A. Clevenger, Maxime Darnon, Qinghuang Lin, Anthony D. Lisi | 2014-01-14 |
| 8624323 | BEOL structures incorporating active devices and mechanical strength | Stephen M. Gates, Daniel C. Edelstein | 2014-01-07 |
| 8525169 | Reliable physical unclonable function for device authentication | Daniel C. Edelstein, Stephen M. Gates, Edward W. Kiewra, Ramachandran Muralidhar, Dirk Pfeiffer | 2013-09-03 |
| 8491987 | Selectively coated self-aligned mask | Matthew E. Colburn, Stephen M. Gates, Jeffrey Hedrick, Elbert E. Huang, Sampath Purushothaman +1 more | 2013-07-23 |
| 8440505 | Semiconductor chips including passivation layer trench structure | Deepak Kulkarni, Michael Lane, Shom Ponoth | 2013-05-14 |
| 8431486 | Interconnect structure for improved time dependent dielectric breakdown | Cyril Cabral, Jr., Sebastian U. Engelmann, Benjamin L. Fletcher, Eric A. Joseph | 2013-04-30 |
| 8421239 | Crenulated wiring structure and method for integrated circuit interconnects | Griselda Bonilla, Elbert E. Huang, Shom Ponoth | 2013-04-16 |
| 8383507 | Method for fabricating air gap interconnect structures | Kaushik Chanda, Cathryn J. Christiansen, Daniel C. Edelstein, Son V. Nguyen, Shom Ponoth +1 more | 2013-02-26 |
| 8357608 | Multi component dielectric layer | Stephen M. Gates, Alfred Grill, Son V. Nguyen | 2013-01-22 |
| 8343868 | Device and methodology for reducing effective dielectric constant in semiconductor devices | Daniel C. Edelstein, Matthew E. Colburn, Edward C. Cooney, III, Timothy J. Dalton, John A. Fitzsimmons +10 more | 2013-01-01 |
| 8338952 | Interconnect structures with ternary patterned features generated from two lithographic processes | Matthew E. Colburn, Elbert E. Huang, Sampath Purushothaman | 2012-12-25 |
| 8288268 | Microelectronic structure including air gap | Daniel C. Edelstein, David V. Horak, Elbert E. Huang, Takeshi Nogami, Shom Ponoth +1 more | 2012-10-16 |
| 8241992 | Method for air gap interconnect integration using photo-patternable low k material | Lawrence A. Clevenger, Maxime Darnon, Qinghuang Lin, Anthony D. Lisi | 2012-08-14 |
| 8237246 | Deep trench crackstops under contacts | Matthew S. Angyal, Lawrence A. Clevenger, Vincent J. McGahay, Shaoning Yao | 2012-08-07 |
| 8129286 | Reducing effective dielectric constant in semiconductor devices | Daniel C. Edelstein, Matthew E. Colburn, Edward C. Cooney, III, Timothy J. Dalton, John A. Fitzsimmons +10 more | 2012-03-06 |
| 8120179 | Air gap interconnect structures and methods for forming the same | Kaushik Chanda, Cathryn J. Christiansen, Daniel C. Edelstein, Son V. Nguyen, Shom Ponoth +1 more | 2012-02-21 |
| 8003520 | Air gap structure having protective metal silicide pads on a metal feature | Griselda Bonilla, Daniel C. Edelstein, Takeshi Nogami, Shom Ponoth, David L. Rath +1 more | 2011-08-23 |