KP

Khokan Chandra Paul

Applied Materials: 13 patents #1,030 of 7,310Top 15%
Overall (All Time): #359,560 of 4,157,543Top 9%
13
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12417890 Methods, systems, and apparatus for monitoring radiation output of lamps Zhepeng CONG, Ashur J. ATANOS, Tao SHENG 2025-09-16
12387956 Systems and methods for controlling non-uniformity Gautam K. Hemani 2025-08-12
12205845 Semiconductor processing chamber to accommodate parasitic plasma formation Tsutomu Tanaka, Adam J. Fischbach, Abhijit A. Kangude, Juan Carlos Rocha-Alvarez 2025-01-21
12142459 Single chamber flowable film formation and treatments Adam J. Fischbach, Tsutomu Tanaka, Canfeng Lai 2024-11-12
12131903 Pulsed-plasma deposition of thin film layers 2024-10-29
12074042 High-density substrate processing systems and methods Jason M. Schaller, Steve Hongkham, Charles T. Carlson, Tuan Nguyen, Swaminathan Srinivasan 2024-08-27
11887811 Semiconductor processing chambers for deposition and etch Ravikumar Patil 2024-01-30
11699571 Semiconductor processing chambers for deposition and etch Ravikumar Patil, Vijet Patil, Carlaton WONG, Adam J. Fischbach, Timothy Franklin +2 more 2023-07-11
11574826 High-density substrate processing systems and methods Jason M. Schaller, Steve Hongkham, Charles T. Carlson, Tuan Nguyen, Swaminathan Srinivasan 2023-02-07
10527407 In-situ metrology method for thickness measurement during PECVD processes Edward W. Budiarto, Todd Egan, Mehdi Vaez-Iravani, Jeongmin Lee, Dale R. Du Bois +1 more 2020-01-07
10388549 On-board metrology (OBM) design and implication in process tool Jay D. Pinson, II, Juan Carlos Rocha-Alvarez, Hari Ponnekanti, Rupankar Choudhury, Shekhar ATHANI +2 more 2019-08-20
10373823 Deployment of light energy within specific spectral bands in specific sequences for deposition, treatment and removal of materials Swaminathan Srinivasan, Atashi Basu, Pramit Manna, Diwakar Kedlaya 2019-08-06
10281261 In-situ metrology method for thickness measurement during PECVD processes Edward W. Budiarto, Todd Egan, Mehdi Vaez-Iravani, Jeongmin Lee, Dale R. Du Bois +1 more 2019-05-07