DD

Dmitry A. Dzilno

Applied Materials: 37 patents #265 of 7,310Top 4%
📍 Sunnyvale, CA: #557 of 14,302 inventorsTop 4%
🗺 California: #12,730 of 386,348 inventorsTop 4%
Overall (All Time): #87,515 of 4,157,543Top 3%
37
Patents All Time

Issued Patents All Time

Showing 26–37 of 37 patents

Patent #TitleCo-InventorsDate
11114282 Phased array modular high-frequency source Philip Allan Kraus, Thai Cheng Chua, Christian Amormino 2021-09-07
11081318 Geometrically selective deposition of dielectric films utilizing low frequency bias Kenichi Ohno, Keiichi Tanaka, Li-Qun Xia, Tsutomu Tanaka, Mario David Silvetti +4 more 2021-08-03
10854428 Spatial atomic layer deposition chamber with plasma pulsing to prevent charge damage Tsutomu Tanaka, Alexander V. Garachtchenko, Keiichi Tanaka 2020-12-01
10763085 Shaped electrodes for improved plasma exposure from vertical plasma source Kallol Bera, Anantha K. Subramani, John C. Forster, Tsutomu Tanaka 2020-09-01
10720311 Phased array modular high-frequency source Philip Allan Kraus, Thai Cheng Chua, Christian Amormino 2020-07-21
10504699 Phased array modular high-frequency source Philip Allan Kraus, Thai Cheng Chua, Christian Amormino 2019-12-10
10312120 Position and temperature monitoring of ALD platen susceptor Abraham Ravid, Kevin Griffin, Joseph Yudovsky, Kaushal Gangakhedkar, Alex Minkovich 2019-06-04
10234261 Fast and continuous eddy-current metrology of a conductive film Edward W. Budiarto, Todd Egan, Jeffrey C. Hudgens, Nir Merry 2019-03-19
9986598 Temperature control apparatus including groove-routed optical fiber heating, substrate temperature control systems, electronic device processing systems, and processing methods Matthew J. Busche, Wendell Glenn Boyd, Jr., Vijay D. Parkhe, Michael R. Rice, Leon Volfovski 2018-05-29
9631919 Non-contact sheet resistance measurement of barrier and/or seed layers prior to electroplating Abraham Ravid, Todd Egan, Robert O. Miller 2017-04-25
9335151 Film measurement Edward W. Budiarto, Todd Egan 2016-05-10
8880210 Methods and apparatus for processing substrates using model-based control Keith Brian Porthouse, John W. Lane, Mariusch Gregor, Nir Merry, Michael R. Rice +2 more 2014-11-04