CL

Christopher F. Lyons

AM AMD: 130 patents #16 of 9,279Top 1%
IBM: 11 patents #9,995 of 70,183Top 15%
SL Spansion Llc.: 3 patents #241 of 769Top 35%
CL Clariant Finance (Bvi) Limited: 1 patents #235 of 535Top 45%
PO Polychrome: 1 patents #17 of 34Top 50%
📍 Wappingers Falls, NY: #7 of 884 inventorsTop 1%
🗺 New York: #259 of 115,490 inventorsTop 1%
Overall (All Time): #6,500 of 4,157,543Top 1%
147
Patents All Time

Issued Patents All Time

Showing 101–125 of 147 patents

Patent #TitleCo-InventorsDate
6210050 Resist developing method and apparatus with nozzle offset for uniform developer application Marina V. Plat 2001-04-03
6200907 Ultra-thin resist and barrier metal/oxide hard mask for metal etch Fei Wang, Khanh B. Nguyen, Scott A. Bell, Harry J. Levinson, Chih-Yuh Yang 2001-03-13
6187666 CVD plasma process to fill contact hole in damascene process Bhanwar Singh, Michael K. Templeton, Bharath Rangarajan, Sanjay K. Yedur, Ramkumar Subramanian 2001-02-13
6183938 Conformal organic coatings for sidewall patterning of sublithographic structures Michael K. Templeton 2001-02-06
6184128 Method using a thin resist mask for dual damascene stop layer etch Fei Wang, Khanh B. Nguyen, Scott A. Bell, Harry J. Levinson, Chih-Yuh Yang 2001-02-06
6171962 Shallow trench isolation formation without planarization mask Olov Karlsson, Basab Bandyopadhyay, Nick Kepler, Larry Wang, Effiong Ibok 2001-01-09
6171763 Ultra-thin resist and oxide/nitride hard mask for metal etch Fei Wang, Khanh B. Nguyen, Scott A. Bell, Harry J. Levinson, Chih-Yuh Yang 2001-01-09
6165695 Thin resist with amorphous silicon hard mask for via etch application Chih-Yuh Yang, Harry J. Levinson, Khanh B. Nguyen, Fei Wang, Scott A. Bell 2000-12-26
6162699 Method for generating limited isolation trench width structures and a device having a narrow isolation trench surrounding its periphery Larry Wang, Nick Kepler, Olov Karlsson, Basab Bandyopadhyay, Effiong Ibok 2000-12-19
6162587 Thin resist with transition metal hard mask for via etch application Chih-Yuh Yang, Harry J. Levinson, Khanh B. Nguyen, Fei Wang, Scott A. Bell 2000-12-19
6156658 Ultra-thin resist and silicon/oxide hard mask for metal etch Fei Wang, Khanh B. Nguyen, Scott A. Bell, Harry J. Levinson, Chih-Yuh Yang 2000-12-05
6156480 Low defect thin resist processing for deep submicron lithography 2000-12-05
6143624 Shallow trench isolation formation with spacer-assisted ion implantation Nick Kepler, Olov Karlsson, Larry Wang, Basab Bandyopadhyay, Effiong Ibok 2000-11-07
6140023 Method for transferring patterns created by lithography Harry J. Levinson, Scott A. Bell, Khanh B. Nguyen, Fei Wang, Chih-Yuh Yang 2000-10-31
6130467 Shallow trench isolation with spacers for improved gate oxide quality Basab Bandyopadhyay, Nick Kepler, Olov Karlsson, Larry Wang, Effiong Ibok 2000-10-10
6127070 Thin resist with nitride hard mask for via etch application Chih-Yuh Yang, Harry J. Levinson, Khanh B. Nguyen, Fei Wang, Scott A. Bell 2000-10-03
6127089 Interconnect structure with low k dielectric materials and method of making the same with single and dual damascene techniques Ramkumar Subramanian, Uzodinma Okoroanyanwu 2000-10-03
6124183 Shallow trench isolation formation with simplified reverse planarization mask Olov Karlsson, Basab Bandyopadhyay, Nick Kepler, Larry Wang, Effiong Ibok 2000-09-26
6121123 Gate pattern formation using a BARC as a hardmask Scott A. Bell, Olov Karlsson 2000-09-19
6114235 Multipurpose cap layer dielectric David K. Foote, Minh Van Ngo, Fei Wang, Raymond T. Lee, William G. En +2 more 2000-09-05
6103611 Methods and arrangements for improved spacer formation within a semiconductor device William G. En, Minh Van Ngo, Chih-Yuh Yang, David K. Foote, Scott A. Bell +1 more 2000-08-15
6090713 Shallow trench isolation formation with simplified reverse planarization mask Olov Karlsson, Basab Bandyophadhyay, Nick Kepler, Larry Wang, Effiong Ibok 2000-07-18
6090712 Shallow trench isolation formation with no polish stop Basab Bandyopadhyay, Nick Kepler, Olov Karlsson, Larry Wang, Effiong Obok 2000-07-18
6087271 Methods for removal of an anti-reflective coating following a resist protect etching process William G. En, Minh Van Ngo, Olov Karlsson, Maria C. Chan 2000-07-11
6074927 Shallow trench isolation formation with trench wall spacer Nick Kepler, Basab Bandyopadhyay, Olov Karlsson, Larry Wang, Effiong Ibok 2000-06-13