YW

Yung-Hsu Wu

TSMC: 54 patents #599 of 12,232Top 5%
Overall (All Time): #46,958 of 4,157,543Top 2%
54
Patents All Time

Issued Patents All Time

Showing 1–25 of 54 patents

Patent #TitleCo-InventorsDate
12412831 Semiconductor device structure and methods of forming the same Wei-Hao Liao, Hsi-Wen Tien, Chih Wei Lu, Cherng-Shiaw Tsai, Chia-Wei Su 2025-09-09
12394633 Method of fabricating semiconductor device with reduced trench distortions Yung-Sung Yen, Chung-Ju Lee, Chun-Kuang Chen, Chia-Tien Wu, Ta-Ching Yu +4 more 2025-08-19
12300600 Semiconductor device with self-aligned conductive features Tai-I Yang, Wei-Chen Chu, Chung-Ju Lee 2025-05-13
12080593 Barrier-less structures Hsin-Ping Chen, Ming-Han Lee, Shin-Yi Yang, Chia-Tien Wu, Shau-Lin Shue +1 more 2024-09-03
12062611 Integrated circuit interconnect structures with air gaps Tai-I Yang, Li-Lin Su, Hsin-Ping Chen, Cheng-Chi Chuang 2024-08-13
12009202 Using a self-assembly layer to facilitate selective formation of an etching stop layer Shao-Kuan Lee, Hsin-Yen Huang, Cheng-Chin Lee, Hai-Ching Chen, Shau-Lin Shue 2024-06-11
11894238 Method of fabricating semiconductor device with reduced trench distortions Yung-Sung Yen, Chung-Ju Lee, Chun-Kuang Chen, Chia-Tien Wu, Ta-Ching Yu +4 more 2024-02-06
11860550 Multi-metal fill with self-aligned patterning and dielectric with voids Tai-I Yang, Wei-Chen Chu, Hsiang-Wei Liu, Shau-Lin Shue, Li-Lin Su 2024-01-02
11848190 Barrier-less structures Hsin-Ping Chen, Chia-Tien Wu, Min Cao, Ming-Han Lee, Shau-Lin Shue +1 more 2023-12-19
11532552 Method and apparatus for forming self-aligned via with selectively deposited etching stop layer Hai-Ching Chen, Jung-Hsun Tsai, Shau-Lin Shue, Tien-I Bao 2022-12-20
11422475 Multi-metal fill with self-aligned patterning and dielectric with voids Tai-I Yang, Wei-Chen Chu, Hsiang-Wei Liu, Shau-Lin Shue, Li-Lin Su 2022-08-23
11404367 Method for forming semiconductor device with self-aligned conductive features Tai-I Yang, Wei-Chen Chu, Chung-Ju Lee 2022-08-02
11387113 Method of fabricating semiconductor device with reduced trench distortions Yung-Sung Yen, Chung-Ju Lee, Chun-Kuang Chen, Chia-Tien Wu, Ta-Ching Yu +4 more 2022-07-12
11244898 Integrated circuit interconnect structures with air gaps Tai-I Yang, Li-Lin Su, Hsin-Ping Chen, Cheng-Chi Chuang 2022-02-08
11069526 Using a self-assembly layer to facilitate selective formation of an etching stop layer Shao-Kuan Lee, Hsin-Yen Huang, Cheng-Chin Lee, Hai-Ching Chen, Shau-Lin Shue 2021-07-20
11011421 Semiconductor device having voids and method of forming same Chien-Hua Huang, Chung-Ju Lee, Tien-I Bao, Shau-Lin Shue 2021-05-18
10916443 Spacer-damage-free etching Tsung-Min Huang, Chung-Ju Lee 2021-02-09
10867913 Method and apparatus for forming self-aligned via with selectively deposited etching stop layer Hai-Ching Chen, Jung-Hsun Tsai, Shau-Lin Shue, Tien-I Bao 2020-12-15
10818509 Method of fabricating semiconductor device with reduced trench distortions Yung-Sung Yen, Chung-Ju Lee, Chun-Kuang Chen, Chia-Tien Wu, Ta-Ching Yu +4 more 2020-10-27
10784160 Semiconductor device having voids and method of forming same Chien-Hua Huang, Chung-Ju Lee, Tien-I Bao, Shau-Lin Shue 2020-09-22
10714421 Structure and formation method of semiconductor device with self-aligned conductive features Tai-I Yang, Wei-Chen Chu, Chung-Ju Lee 2020-07-14
10534273 Multi-metal fill with self-aligned patterning and dielectric with voids Tai-I Yang, Wei-Chen Chu, Hsiang-Wei Liu, Shau-Lin Shue, Li-Lin Su 2020-01-14
10283371 Spacer-damage-free etching Tsung-Min Huang, Chung-Ju Lee 2019-05-07
10269634 Semiconductor device having voids and method of forming same Chien-Hua Huang, Chung-Ju Lee, Tien-I Bao, Shau-Lin Shue 2019-04-23
10170306 Method of double patterning lithography process using plurality of mandrels for integrated circuit applications Chung-Ju Lee, Hsin-Chieh Yao, Shau-Lin Shue, Tien-I Bao 2019-01-01