Issued Patents All Time
Showing 1–25 of 79 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12322742 | Semiconductor structure and manufacturing method thereof | Hsiang-Tai Lu, Shuo-Mao Chen, Feng-Cheng Hsu, Chao-Hsiang Yang, Shin-Puu Jeng +4 more | 2025-06-03 |
| 12105131 | Antenna testing device for high frequency antennas | Chi-Chang Lai, Kai Tang | 2024-10-01 |
| 12062586 | Semiconductor device structure with magnetic element | Tang-Jung Chiu, Chi-Chang Lai, Chia-Heng Tsai, Mirng-Ji Lii, Weil Liao | 2024-08-13 |
| 12019097 | Method for forming probe head structure | Wen-Yi Lin, Hao Chen, Chuan-Hsiang Sun, Chien-Chen Li, Chen-Shien Chen | 2024-06-25 |
| 11906573 | Testing module and testing method using the same | Hao Chen | 2024-02-20 |
| 11855066 | Semiconductor structure and manufacturing method thereof | Hsiang-Tai Lu, Shuo-Mao Chen, Feng-Cheng Hsu, Chao-Hsiang Yang, Shin-Puu Jeng +4 more | 2023-12-26 |
| 11852672 | Test circuit and method | Ching-Nen Peng, Hung-Chih Lin, Sen-Kuei Hsu, Chuan-Ching Wang, Hao Chen | 2023-12-26 |
| 11726122 | Antenna testing device and method for high frequency antennas | Chi-Chang Lai, Kai Tang | 2023-08-15 |
| 11726112 | Electromagnetic shielding during wafer stage testing | Ching-Nen Peng, Hsien-Tang Wang, Chi-Chang Lai | 2023-08-15 |
| 11693045 | Testing module and testing method using the same | Hao Chen | 2023-07-04 |
| 11631621 | Semiconductor device structure with magnetic element | Tang-Jung Chiu, Chi-Chang Lai, Chia-Heng Tsai, Mirng-Ji Lii, Weii LIAO | 2023-04-18 |
| 11585831 | Test probing structure | Ching-Fang Chen, Sandeep Kumar Goel, Chung-Sheng Yuan, Chao-Yang Yeh, Chin-Chou Liu +2 more | 2023-02-21 |
| 11585846 | Testing module and testing method using the same | Hao Chen | 2023-02-21 |
| 11579190 | Testing holders for chip unit and die package | Kuo-Chuan Liu, Ching-Nen Peng, Hung-Chih Lin, Hao Chen | 2023-02-14 |
| 11467203 | Test circuit and method | Ching-Nen Peng, Hung-Chih Lin, Sen-Kuei Hsu, Chuan-Ching Wang, Hao Chen | 2022-10-11 |
| 11340291 | Testing holders for chip unit and die package | Kuo-Chuan Liu, Ching-Nen Peng, Hung-Chih Lin, Hao Chen | 2022-05-24 |
| 11335672 | Semiconductor structure and manufacturing method thereof | Hsiang-Tai Lu, Shuo-Mao Chen, Feng-Cheng Hsu, Chao-Hsiang Yang, Shin-Puu Jeng +4 more | 2022-05-17 |
| 11293974 | System and method for semiconductor device testing | Hao Chen | 2022-04-05 |
| 11249112 | Devices for high-density probing techniques and method of implementing the same | Ching-Nen Peng, Hung-Chih Lin, Wei-Hsun Lin, Sen-Kuei Hsu, De-Jian Liu | 2022-02-15 |
| 11231453 | Alignment testing for tiered semiconductor structure | Ching-Nen Peng, Hung-Chih Lin, Hao Chen, Mincent Lee | 2022-01-25 |
| 11229109 | Three dimensional integrated circuit electrostatic discharge protection and prevention test interface | Ching-Nen Peng, Hung-Chih Lin, Hao-Chiang Cheng | 2022-01-18 |
| 11199578 | Testing apparatus and testing method | Tang-Jung Chiu, Hung-Chih Lin | 2021-12-14 |
| 11199576 | Probe head structure of probe card and testing method | Ming-Cheng Hsu | 2021-12-14 |
| 11029331 | Universal test mechanism for semiconductor device | Chi-Che Wu, Hung-Chih Lin, Hao Chen | 2021-06-08 |
| 11018065 | Semiconductor device structure with magnetic element in testing region | Tang-Jung Chiu, Chi-Chang Lai, Chia-Heng Tsai, Mirng-Ji Lii, Weii LIAO | 2021-05-25 |