Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11231453 | Alignment testing for tiered semiconductor structure | Mill-Jer Wang, Ching-Nen Peng, Hung-Chih Lin, Hao Chen | 2022-01-25 |
| 10641819 | Alignment testing for tiered semiconductor structure | Mill-Jer Wang, Ching-Nen Peng, Hung-Chih Lin, Hao Chen | 2020-05-05 |
| 10073135 | Alignment testing for tiered semiconductor structure | Mill-Jer Wang, Ching-Nen Peng, Hung-Chih Lin, Hao Chen | 2018-09-11 |
| 9915699 | Integrated fan-out pillar probe system | Mill-Jer Wang, Ching-Nen Peng, Hung-Chih Lin, Hao Chen, Chen-Hung Tien +1 more | 2018-03-13 |
| 9658281 | Alignment testing for tiered semiconductor structure | Mill-Jer Wang, Ching-Nen Peng, Hung-Chih Lin, Hao Chen | 2017-05-23 |
| 8095832 | Method for repairing memory and system thereof | Cheng-Wen Wu | 2012-01-10 |