Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12062586 | Semiconductor device structure with magnetic element | Mill-Jer Wang, Chi-Chang Lai, Chia-Heng Tsai, Mirng-Ji Lii, Weil Liao | 2024-08-13 |
| 11631621 | Semiconductor device structure with magnetic element | Mill-Jer Wang, Chi-Chang Lai, Chia-Heng Tsai, Mirng-Ji Lii, Weii LIAO | 2023-04-18 |
| 11199578 | Testing apparatus and testing method | Hung-Chih Lin, Mill-Jer Wang | 2021-12-14 |
| 11018065 | Semiconductor device structure with magnetic element in testing region | Mill-Jer Wang, Chi-Chang Lai, Chia-Heng Tsai, Mirng-Ji Lii, Weii LIAO | 2021-05-25 |
| 10634717 | Testing apparatus and testing method | Hung-Chih Lin, Mill-Jer Wang | 2020-04-28 |
| 9859176 | Semiconductor device, test system and method of the same | Mill-Jer Wang, Hung-Chih Lin, Hao Chen | 2018-01-02 |
| 9653427 | Integrated circuit package with probe pad structure | Chi-Hsi Wu, Chen-Hua Yu, Hsiang-Fan Lee, Shih-Peng Tai, Wen-Chih Chiou | 2017-05-16 |
| 9281254 | Methods of forming integrated circuit package | Chen-Hua Yu, Chi-Hsi Wu, Wen-Chih Chiou, Hsiang-Fan Lee, Shih-Peng Tai | 2016-03-08 |
| 8604549 | Multi-gate field-effect transistor with enhanced and adaptable low-frequency noise | Jeng Gong, Hsin Chen | 2013-12-10 |