Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12345760 | Apparatus for probing device-under-test | Bo-You Chen, Chi-Chang Lai, Hsiou-Yu He, Peiwei Lin | 2025-07-01 |
| 12019097 | Method for forming probe head structure | Wen-Yi Lin, Hao Chen, Mill-Jer Wang, Chien-Chen Li, Chen-Shien Chen | 2024-06-25 |
| 11821942 | Apparatus and method for probing device-under-test | Bo-You Chen, Chi-Chang Lai, Hsiou-Yu He, Peiwei Lin | 2023-11-21 |