Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12393336 | Data storage method, host system and data storage system | Jian Ping Syu, Szu-Wei Chen, An-Cin Li | 2025-08-19 |
| 12313675 | Method and device for wafer-level testing | Jun He, Yu-Ting Lin, Yung-Liang Kuo, Yinlung Lu | 2025-05-27 |
| 12270852 | Method and system for wafer-level testing | Jun He, Yu-Ting Lin, Yung-Liang Kuo, Yinlung Lu | 2025-04-08 |
| 12066484 | Method and device for wafer-level testing | Jun He, Yu-Ting Lin, Yung-Liang Kuo, Yinlung Lu | 2024-08-20 |
| 12025655 | Method and system for wafer-level testing | Jun He, Yu-Ting Lin, Yung-Liang Kuo, Yinlung Lu | 2024-07-02 |
| 11754621 | Method and device for wafer-level testing | Jun He, Yu-Ting Lin, Yung-Liang Kuo, Yinlung Lu | 2023-09-12 |
| 11630149 | Method and system for wafer-level testing | Jun He, Yu-Ting Lin, Yung-Liang Kuo, Yinlung Lu | 2023-04-18 |
| 11448692 | Method and device for wafer-level testing | Jun He, Yu-Ting Lin, Yung-Liang Kuo, Yinlung Lu | 2022-09-20 |
| 11386019 | Data protection method and storage device | Yu-Tien Chang, Ching-Ming Chen, Lin Hsu, Tsung-Wei Hung | 2022-07-12 |
| 11249112 | Devices for high-density probing techniques and method of implementing the same | Mill-Jer Wang, Ching-Nen Peng, Hung-Chih Lin, Sen-Kuei Hsu, De-Jian Liu | 2022-02-15 |
| 11073551 | Method and system for wafer-level testing | Jun He, Yu-Ting Lin, Yung-Liang Kuo, Yinlung Lu | 2021-07-27 |
| 10718790 | Devices for high-density probing techniques and method of implementing the same | Mill-Jer Wang, Ching-Nen Peng, Hung-Chih Lin, Sen-Kuei Hsu, De-Jian Liu | 2020-07-21 |
| 10274518 | Devices for high-density probing techniques and method of implementing the same | Mill-Jer Wang, Ching-Nen Peng, Hung-Chih Lin, Sen-Kuei Hsu, De-Jian Liu | 2019-04-30 |
| 9902881 | Photosensitive adhesive | Kai-Chieh Chang, Chen-Yu Li, Yao-Kuei Hsiao | 2018-02-27 |
| 9494562 | Method and apparatus for defect detection in composite structures | Lay Siong Goh, Lye Seng Wong, Heng Kiat Jonathan Hey, Ricky Riyadi Chan, Roman Britner | 2016-11-15 |
| 9372227 | Integrated circuit test system and method | Mill-Jer Wang, Ching-Nen Peng, Hung-Chih Lin, Hao Chen, Chung-Han Huang | 2016-06-21 |
| 9354254 | Test-yield improvement devices for high-density probing techniques and method of implementing the same | Mill-Jer Wang, Ching-Nen Peng, Hung-Chih Lin, Sen-Kuei Hsu, De-Jian Liu | 2016-05-31 |