Issued Patents All Time
Showing 51–75 of 84 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8409456 | Planarization method for high wafer topography | Shun-Wei LAN, Jieh-Jang Chen, Shih-Wei Lin, Feng-Jia Shiu | 2013-04-02 |
| 8313889 | Double patterning method using metallic compound mask layer | Vincent Yu, Chih-Yang Yeh | 2012-11-20 |
| 8236579 | Methods and systems for lithography alignment | Hsiao-Tzu Lu, Kuei-Shun Chen, Hsueh-Hung Fu, Ching-Hua Hsieh, Shau-Lin Shue | 2012-08-07 |
| 8198118 | Method for forming a robust mask with reduced light scattering | Ken Wu, Chang-Cheng Hung, Luke Hsu, Ren-Guey Hsieh, Hsin-Chang Lee +1 more | 2012-06-12 |
| 8098364 | Exposure apparatus and method for photolithography process | Vinvent Yu, Hsien-Cheng Wang | 2012-01-17 |
| 7999910 | System and method for manufacturing a mask for semiconductor processing | Chia-Jen Chen, Hsin-Chang Lee, Sheng-Chi Chin, Burn Jeng Lin | 2011-08-16 |
| 7972163 | Electrical connector having latching mechanism | Hung-Chuan Chen, Chin-Hsing Lin | 2011-07-05 |
| 7897297 | Method and system for optimizing intra-field critical dimension uniformity using a sacrificial twin mask | Chih-Ming Ke, Tsai-Sheng Gau, Shinn-Sheng Yu | 2011-03-01 |
| 7780481 | Composite connector assembly and power supply apparatus having such composite connector assembly | Hung-Chuan Chen | 2010-08-24 |
| 7759136 | Critical dimension (CD) control by spectrum metrology | Chang-Cheng Hung, Shih-Ming Chang, Wen-Chuan Wang, Chi-Lun Lu, Allen Hsia +1 more | 2010-07-20 |
| 7697114 | Method and apparatus for compensated illumination for advanced lithography | Shih-Ming Chang, Wen-Chuan Wang, Chih-Cheng Chin, Chi-Lun Lu, Sheng-Chi Chin | 2010-04-13 |
| 7642532 | Aperture design for improving critical dimension accuracy and electron beam lithography throughput | Chia-Jen Chen, Hsin-Chang Lee | 2010-01-05 |
| 7589970 | Assembled structure of power semiconductor device and heat sink | — | 2009-09-15 |
| 7469057 | System and method for inspecting errors on a wafer | Chang-Cheng Hung, Hsen-Lin Wu, Tyng-Hao Hsu | 2008-12-23 |
| 7431592 | Circuit protecting structure of electronic device | Ming-Ling Huang | 2008-10-07 |
| 7383530 | System and method for examining mask pattern fidelity | Wen-Chuan Wang, Shih-Ming Chang, Chih-Cheng Chin, Chi-Lun Lu, Sheng-Chi Chin | 2008-06-03 |
| 7335048 | Electrical connector having latching mechanism | Hung-Chuan Chen, Szu-Lu Huang | 2008-02-26 |
| 7279428 | Method of preventing photoresist residues | Shang-Wei Lin | 2007-10-09 |
| 7218400 | In-situ overlay alignment | Grace H. Ho, Ming-Che Wu, Li-Heng Chou, Jung-Ting Chen, Yao-Ching Ku | 2007-05-15 |
| 7060400 | Method to improve photomask critical dimension uniformity and photomask fabrication process | Wen-Chuan Wang, Shih-Ming Chang, Chih-Chen Chin, Chi-Lun Lu, Sheng-Chi Chin | 2006-06-13 |
| 6995979 | Heat-dissipating fan module of electronic apparatus | Chih-Chi Wu, Jui-Yuan Hsu, Chih-Jen Chen, Min-Wen Kao, Jen-Chieh Peng | 2006-02-07 |
| 6930883 | Heat-dispersing module of electronic device | Chih-Chi Wu, Jui-Yuan Hsu, Chih-Jen Chen, Min-Kuang Chang | 2005-08-16 |
| 6858354 | Method to prevent side lobe on seal ring | Chang-Cheng Hung | 2005-02-22 |
| 6570642 | Method and apparatus for placing identifying mark on semiconductor wafer | Yung-Sheng Huang | 2003-05-27 |
| 6362093 | Dual damascene method employing sacrificial via fill layer | Syun-Ming Jang, Anthony Yen | 2002-03-26 |