Issued Patents All Time
Showing 1–25 of 65 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12429776 | Lithography method with reduced impacts of mask defects | Shinn-Sheng Yu, Ching-Fang Yu, Ting-Hao Hsu, Sheng-Chi Chin, Anthony Yen | 2025-09-30 |
| 12283215 | Display device and driving method thereof | Ian French, Kuang-Heng Liang, Chih-Ching Wang | 2025-04-22 |
| 11100272 | Wafer-to-design image analysis (WDIA) system | Cheng-Chi Wu | 2021-08-24 |
| 11061317 | Method of fabricating an integrated circuit with non-printable dummy features | Jyuh-Fuh Lin, Cheng-Hung Chen, Pei-Yi Liu, Shy-Jay Lin, Burn Jeng Lin | 2021-07-13 |
| 10955746 | Lithography method with reduced impacts of mask defects | Shinn-Sheng Yu, Ching-Fang Yu, Ting-Hao Hsu, Sheng-Chi Chin, Anthony Yen | 2021-03-23 |
| 10811225 | Method of fabricating an integrated circuit with a pattern density-outlier-treatment for optimized pattern density uniformity | Jyuh-Fuh Lin, Cheng-Hung Chen, Pei-Yi Liu, Shy-Jay Lin, Burn Jeng Lin | 2020-10-20 |
| 10495982 | System and method for real-time overlay error reduction | Shih-Ming Chang | 2019-12-03 |
| 10431423 | Method of fabricating an integrated circuit with a pattern density-outlier-treatment for optimized pattern density uniformity | Jyuh-Fuh Lin, Cheng-Hung Chen, Pei-Yi Liu, Shy-Jay Lin, Burn Jeng Lin | 2019-10-01 |
| 10359695 | Method of fabricating an integrated circuit with non-printable dummy features | Jyuh-Fuh Lin, Cheng-Hung Chen, Pei-Yi Liu, Shy-Jay Lin, Burn Jeng Lin | 2019-07-23 |
| 10175820 | Verification apparatus and verification method for touch display panel | Shao-Lun Chang, Chang-Sheng Weng, Chi-Liang Kuo | 2019-01-08 |
| 10170276 | Method of fabricating an integrated circuit with a pattern density-outlier-treatment for optimized pattern density uniformity | Jyuh-Fuh Lin, Cheng-Hung Chen, Pei-Yi Liu, Shy-Jay Lin, Burn Jeng Lin | 2019-01-01 |
| 10008171 | Gate driving circuit with isolating switch for display device using the same | Wei-Lien Sung, Han Liu, Chi-Liang Kuo, Yuan-Hao Chang, Wen-Che Wang +3 more | 2018-06-26 |
| 9966032 | Driving circuit and driving method | Han Liu, Wei-Lien Sung, Shao-Lun Chang, Shih-Chieh Lin | 2018-05-08 |
| 9870612 | Method for repairing a mask | Shinn-Sheng Yu, Anthony Yen, Sheng-Chi Chin | 2018-01-16 |
| 9810994 | Systems and methods for high-throughput and small-footprint scanning exposure for lithography | Burn Jeng Lin, Shy-Jay Lin, Jaw-Jung Shin | 2017-11-07 |
| 9792869 | Display panel | Wei-Lien Sung, Han Liu, Shao-Lun Chang, Shih-Chieh Lin, Po-Tsun Liu +2 more | 2017-10-17 |
| 9761411 | System and method for maskless direct write lithography | Cheng-Chi Wu, Jensen Yang, Shy-Jay Lin | 2017-09-12 |
| 9678434 | Grid refinement method | Burn Jeng Lin, Jaw-Jung Shin, Pei-Yi Liu, Shy-Jay Lin | 2017-06-13 |
| 9658538 | System and technique for rasterizing circuit layout data | Pei-Yi Liu, Cheng-Chi Wu, Cheng-Hung Chen, Jyuh-Fuh Lin, Shy-Jay Lin | 2017-05-23 |
| 9594862 | Method of fabricating an integrated circuit with non-printable dummy features | Jyuh-Fuh Lin, Cheng-Hung Chen, Pei-Yi Liu, Shy-Jay Lin, Burn Jeng Lin | 2017-03-14 |
| 9589764 | Electron beam lithography process with multiple columns | Shy-Jay Lin | 2017-03-07 |
| 9552964 | Method of fabricating an integrated circuit with a pattern density-outlier-treatment for optimized pattern density uniformity | Jyuh-Fuh Lin, Cheng-Hung Chen, Pei-Yi Liu, Shy-Jay Lin, Burn Jeng Lin | 2017-01-24 |
| 9529271 | Grid refinement method | Burn Jeng Lin, Jaw-Jung Shin, Pei-Yi Liu, Shy-Jay Lin | 2016-12-27 |
| 9519225 | Systems and methods for high-throughput and small-footprint scanning exposure for lithography | Burn Jeng Lin, Shy-Jay Lin, Jaw-Jung Shin | 2016-12-13 |
| 9436788 | Method of fabricating an integrated circuit with block dummy for optimized pattern density uniformity | Jyuh-Fuh Lin, Pei-Yi Liu, Cheng-Hung Chen, Shy-Jay Lin, Burn Jeng Lin | 2016-09-06 |