JL

Jyuh-Fuh Lin

TSMC: 11 patents #2,595 of 12,232Top 25%
📍 Gongguan, TW: #42 of 523 inventorsTop 9%
Overall (All Time): #453,714 of 4,157,543Top 15%
11
Patents All Time

Issued Patents All Time

Showing 1–11 of 11 patents

Patent #TitleCo-InventorsDate
11061317 Method of fabricating an integrated circuit with non-printable dummy features Cheng-Hung Chen, Pei-Yi Liu, Wen-Chuan Wang, Shy-Jay Lin, Burn Jeng Lin 2021-07-13
10811225 Method of fabricating an integrated circuit with a pattern density-outlier-treatment for optimized pattern density uniformity Cheng-Hung Chen, Pei-Yi Liu, Wen-Chuan Wang, Shy-Jay Lin, Burn Jeng Lin 2020-10-20
10431423 Method of fabricating an integrated circuit with a pattern density-outlier-treatment for optimized pattern density uniformity Cheng-Hung Chen, Pei-Yi Liu, Wen-Chuan Wang, Shy-Jay Lin, Burn Jeng Lin 2019-10-01
10359695 Method of fabricating an integrated circuit with non-printable dummy features Cheng-Hung Chen, Pei-Yi Liu, Wen-Chuan Wang, Shy-Jay Lin, Burn Jeng Lin 2019-07-23
10170276 Method of fabricating an integrated circuit with a pattern density-outlier-treatment for optimized pattern density uniformity Cheng-Hung Chen, Pei-Yi Liu, Wen-Chuan Wang, Shy-Jay Lin, Burn Jeng Lin 2019-01-01
9658538 System and technique for rasterizing circuit layout data Pei-Yi Liu, Cheng-Chi Wu, Cheng-Hung Chen, Wen-Chuan Wang, Shy-Jay Lin 2017-05-23
9594862 Method of fabricating an integrated circuit with non-printable dummy features Cheng-Hung Chen, Pei-Yi Liu, Wen-Chuan Wang, Shy-Jay Lin, Burn Jeng Lin 2017-03-14
9552964 Method of fabricating an integrated circuit with a pattern density-outlier-treatment for optimized pattern density uniformity Cheng-Hung Chen, Pei-Yi Liu, Wen-Chuan Wang, Shy-Jay Lin, Burn Jeng Lin 2017-01-24
9436788 Method of fabricating an integrated circuit with block dummy for optimized pattern density uniformity Pei-Yi Liu, Cheng-Hung Chen, Wen-Chuan Wang, Shy-Jay Lin, Burn Jeng Lin 2016-09-06
9436787 Method of fabricating an integrated circuit with optimized pattern density uniformity Pei-Yi Liu, Cheng-Hung Chen, Wen-Chuan Wang, Shy-Jay Lin, Burn Jeng Lin 2016-09-06
8755045 Detecting method for forming semiconductor device Te-Chih Huang, Guo-Tsai Huang, Jia-Rui Hu, Chih-Ming Ke 2014-06-17