AH

Allen Hsia

TSMC: 1 patents #8,466 of 12,232Top 70%
📍 Baoshan, TW: #2,187 of 3,661 inventorsTop 60%
Overall (All Time): #3,296,156 of 4,157,543Top 80%
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
7759136 Critical dimension (CD) control by spectrum metrology Chang-Cheng Hung, Hung-Chang Hsieh, Shih-Ming Chang, Wen-Chuan Wang, Chi-Lun Lu +1 more 2010-07-20