Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11243573 | Semiconductor package, display apparatus and manufacturing method of semiconductor package | Cheng-Tung Hsu, Tyrone Kuo | 2022-02-08 |
| 8624345 | Photomask and photomask substrate with reduced light scattering properties | Ken Wu, Hung-Chang Hsieh, Luke Hsu, Ren-Guey Hsieh, Hsin-Chang Lee +1 more | 2014-01-07 |
| 8617410 | Method and system for wafer inspection | Tsai-Sheng Gau | 2013-12-31 |
| 8198118 | Method for forming a robust mask with reduced light scattering | Ken Wu, Hung-Chang Hsieh, Luke Hsu, Ren-Guey Hsieh, Hsin-Chang Lee +1 more | 2012-06-12 |
| 8046860 | System and method for removing particles in semiconductor manufacturing | Chen-Yuan Hsia, Chi-Lun Lu, Shih-Ming Chang, Wen-Chuan Wang, Yen-Bin Huang +2 more | 2011-11-01 |
| 8038897 | Method and system for wafer inspection | Tsai-Sheng Gau | 2011-10-18 |
| 7819980 | System and method for removing particles in semiconductor manufacturing | Chen-Yuan Hsia, Chi-Lun Lu, Shih-Ming Chang, Wen-Chuan Wang, Yen-Bin Huang +2 more | 2010-10-26 |
| 7759136 | Critical dimension (CD) control by spectrum metrology | Hung-Chang Hsieh, Shih-Ming Chang, Wen-Chuan Wang, Chi-Lun Lu, Allen Hsia +1 more | 2010-07-20 |
| 7469057 | System and method for inspecting errors on a wafer | Hung-Chang Hsieh, Hsen-Lin Wu, Tyng-Hao Hsu | 2008-12-23 |
| 7460251 | Dimension monitoring method and system | Shih-Ming Chang, Chen-Yuan Hsia, Wen-Chuan Wang, Chi-Lun Lu, Yen-Bin Huang +4 more | 2008-12-02 |
| 7162071 | Progressive self-learning defect review and classification method | Tyng-Hao Hsu, Chin-Hsiang Lin, Chuan-Yuan Lin, Shin-Ying Chen | 2007-01-09 |
| 7035449 | Method for applying a defect finder mark to a backend photomask making process | Chuan-Yuan Lin, Tyng-Hao Hsu, Shu-Chun Lin, Chin-Hsiang Lin | 2006-04-25 |
| 6861179 | Charge effect and electrostatic damage prevention method on photo-mask | Ren-Guey Hsieh, Jaw-Jung Shin | 2005-03-01 |
| 6858354 | Method to prevent side lobe on seal ring | Hung-Chang Hsieh | 2005-02-22 |
| 6858353 | Increased-contrast film for high-transmittance attenuated phase-shaft masks | Chia-Yang Chang, Tyng-Hao Hsu, Chin-Hsiang Lin | 2005-02-22 |
| 6653029 | Dual-focused ion beams for semiconductor image scanning and mask repair | Chuan-Yuan Lin, Chih-Cheng Chin, Chin-Hsiang Lin | 2003-11-25 |
| 6365303 | Electrostatic discharge damage prevention method on masks | Jeen-Hao Liu, Yi-Hsu Chen, Yung-Haw Liaw, Dong-Hsu Cheng, Deng-Guey Juang | 2002-04-02 |