CL

Chi-Lun Lu

TSMC: 38 patents #895 of 12,232Top 8%
Overall (All Time): #84,601 of 4,157,543Top 3%
38
Patents All Time

Issued Patents All Time

Showing 1–25 of 38 patents

Patent #TitleCo-InventorsDate
12353120 EUV photo masks and manufacturing method thereof Wei-Che Hsieh, Ping-Hsun Lin, Fu-Sheng Chu, Ta-Cheng Lien, Hsin-Chang Lee 2025-07-08
12276906 Methods for cleaning lithography mask I-Hsiung Huang, Yung-Cheng Chen 2025-04-15
11822230 EUV pellicle and mounting method thereof on photo mask Wen-Yao Wei, Hsin-Chang Lee 2023-11-21
11378894 Lithography system with an embedded cleaning module Shang-Chieh Chien, Jeng-Horng Chen, Jui-Ching Wu, Chia-Chen Chen, Hung-Chang Hsieh +3 more 2022-07-05
11079669 System and method for localized EUV pellicle glue removal Tzu-Ting Chou, Chung-Hsuan Liu, Kuan-Wen Lin, Ting-Hao Hsu, Sheng-Chi Chin 2021-08-03
11003069 High durability extreme ultraviolet photomask Chia-Hao Yu, Chih-Tsung Shih, Ching-Wei Shen, Jeng-Horng Chen 2021-05-11
10642148 High durability extreme ultraviolet photomask Chia-Hao Yu, Chih-Tsung Shih, Ching-Wei Shen, Jeng-Horng Chen 2020-05-05
10520805 System and method for localized EUV pellicle glue removal Tzu-Ting Chou, Chung-Hsuan Liu, Kuan-Wen Lin, Ting-Hao Hsu, Sheng-Chi Chin 2019-12-31
10459353 Lithography system with an embedded cleaning module Shang-Chieh Chien, Jeng-Horng Chen, Jui-Ching Wu, Chia-Chen Chen, Hung-Chang Hsieh +3 more 2019-10-29
10156784 Systems and methods of EUV mask cleaning Ching-Wei Shen, Kuan-Wen Lin 2018-12-18
10067418 Particle removal system and method thereof Shu-Hao Chang, Shang-Chieh Chien, Ming-Chin Chien, Jui-Ching Wu, Jeng-Horng Chen +2 more 2018-09-04
10061191 High durability extreme ultraviolet photomask Chia-Hao Yu, Chih-Tsung Shih, Ching-Wei Shen, Jeng-Horng Chen 2018-08-28
9889477 Method and apparatus for enhanced cleaning and inspection Sheng-Chi Chin 2018-02-13
9885952 Systems and methods of EUV mask cleaning Ching-Wei Shen, Kuan-Wen Lin 2018-02-06
9740094 Damage prevention on EUV mask Kuan-Wen Lin, Ching-Wei Shen, Shu-Hsien Wu 2017-08-22
9665000 Method and system for EUV mask cleaning with non-thermal solution Ching-Wei Shen, Kuan-Wen Lin 2017-05-30
9612523 Structure and method for reflective-type mask Chih-Tsung Shih, Jeng-Horng Chen, Chia-Chen Chen, Shinn-Sheng Yu, Anthony Yen +1 more 2017-04-04
9418847 Lithography system and method for haze elimination Ching-Wei Shen, Kuan-Wen Lin, Ting-Hao Hsu, Sheng-Chi Chin, Anthony Yen 2016-08-16
9138785 Method and apparatus for enhanced cleaning and inspection Sheng-Chi Chin 2015-09-22
9046781 Structure and method for reflective-type mask Chih-Tsung Shih, Shinn-Sheng Yu, Jeng-Horng Chen, Wei Liu, Chia-Chen Chen +1 more 2015-06-02
8932958 Device manufacturing and cleaning method Kuan-Wen Lin, Ching-Wei Shen, Ting-Hao Hsu, Sheng-Chi Chin 2015-01-13
8888948 Apparatus and method for controlling relative particle concentrations in a plasma Shih-Ming Chang 2014-11-18
8758963 Holographic reticle and patterning method Shih-Ming Chang, Chung-Hsing Chang, Wen-Chuan Wang, Sheng-Chi Chin, Chin-Hsiang Lin +1 more 2014-06-24
8598042 Device manufacturing and cleaning method Kuan-Wen Lin, Ching-Wei Shen, Ting-Hao Hsu, Sheng-Chi Chin 2013-12-03
8282850 Apparatus and method for controlling relative particle concentrations in a plasma Shih-Ming Chang 2012-10-09