KL

Kuan-Wen Lin

TSMC: 20 patents #1,647 of 12,232Top 15%
Overall (All Time): #215,554 of 4,157,543Top 6%
20
Patents All Time

Issued Patents All Time

Showing 1–20 of 20 patents

Patent #TitleCo-InventorsDate
12393129 Method and device for cleaning substrates Chung-Hsuan Liu, Chen-Yang Lin, Ku-Hsiang Sung, Da-Wei Yu, Chia-Jen Chen +1 more 2025-08-19
12320782 Acoustic measurement of fabrication equipment clearance Jun DENG, Sheng-Chi Chin, Yu-Ching Lee 2025-06-03
12085866 Particle removing assembly and method of cleaning mask for lithography Chen-Yang Lin, Da-Wei Yu, Li-Hsin Wang, Chia-Jen Chen, Hsin-Chang Lee 2024-09-10
12032302 Method and device for cleaning substrates Chung-Hsuan Liu, Chen-Yang Lin, Ku-Hsiang Sung, Da-Wei Yu, Chia-Jen Chen +1 more 2024-07-09
11709153 Acoustic measurement of fabrication equipment clearance Jun DENG, Sheng-Chi Chin, Yu-Ching Lee 2023-07-25
11698592 Particle removing assembly and method of cleaning mask for lithography Chen-Yang Lin, Da-Wei Yu, Li-Hsin Wang, Chia-Jen Chen, Hsin-Chang Lee 2023-07-11
11430671 Ozone wafer cleaning module having an ultraviolet lamp module with rotatable reflectors Chen-Yang Lin, Chung-Hsuan Liu, Ku-Hsiang Sung, Chia-Jen Chen, Hsin-Chang Lee 2022-08-30
11294292 Particle removing assembly and method of cleaning mask for lithography Chen-Yang Lin, Da-Wei Yu, Li-Hsin Wang, Chia-Jen Chen, Hsin-Chang Lee 2022-04-05
11079669 System and method for localized EUV pellicle glue removal Tzu-Ting Chou, Chung-Hsuan Liu, Chi-Lun Lu, Ting-Hao Hsu, Sheng-Chi Chin 2021-08-03
10845342 Acoustic measurement of film thickness Jun DENG, Sheng-Chi Chin, Yu-Ching Lee 2020-11-24
10794872 Acoustic measurement of fabrication equipment clearance Jun DENG, Sheng-Chi Chin, Yu-Ching Lee 2020-10-06
10520805 System and method for localized EUV pellicle glue removal Tzu-Ting Chou, Chung-Hsuan Liu, Chi-Lun Lu, Ting-Hao Hsu, Sheng-Chi Chin 2019-12-31
10156784 Systems and methods of EUV mask cleaning Ching-Wei Shen, Chi-Lun Lu 2018-12-18
9885952 Systems and methods of EUV mask cleaning Ching-Wei Shen, Chi-Lun Lu 2018-02-06
9740094 Damage prevention on EUV mask Chi-Lun Lu, Ching-Wei Shen, Shu-Hsien Wu 2017-08-22
9665000 Method and system for EUV mask cleaning with non-thermal solution Ching-Wei Shen, Chi-Lun Lu 2017-05-30
9658526 Mask pellicle indicator for haze prevention Sheng-Chi Chin, Ting-Hao Hsu, Tzu-Ting Chou, Shu-Hsien Wu 2017-05-23
9418847 Lithography system and method for haze elimination Ching-Wei Shen, Chi-Lun Lu, Ting-Hao Hsu, Sheng-Chi Chin, Anthony Yen 2016-08-16
8932958 Device manufacturing and cleaning method Chi-Lun Lu, Ching-Wei Shen, Ting-Hao Hsu, Sheng-Chi Chin 2015-01-13
8598042 Device manufacturing and cleaning method Chi-Lun Lu, Ching-Wei Shen, Ting-Hao Hsu, Sheng-Chi Chin 2013-12-03