Issued Patents All Time
Showing 76–84 of 84 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6352818 | Photoresist development method employing multiple photoresist developer rinse | — | 2002-03-05 |
| 6350680 | Pad alignment for AlCu pad for copper process | Tsu Shih, Chen-Cheng Kuo | 2002-02-26 |
| 6319821 | Dual damascene approach for small geometry dimension | Jen-Cheng Liu, Chen-Cheng Kuo, Chia-Shiung Tsai | 2001-11-20 |
| 6312876 | Method for placing identifying mark on semiconductor wafer | Yung-Sheng Huang | 2001-11-06 |
| 6242813 | Deep-submicron integrated circuit package for improving bondability | Yung-Sheng Huang, Han-Chang Hsieh | 2001-06-05 |
| 6174818 | Method of patterning narrow gate electrode | Hun-Jan Tao, Huan-Just Lin, Chu-Yun Fu, Ying-Ying Wang, Chia-Shiung Tsai +1 more | 2001-01-16 |
| 6110816 | Method for improving bondability for deep-submicron integrated circuit package | Yung-Sheng Huang, Han-Chang Hsieh | 2000-08-29 |
| 6090674 | Method of forming a hole in the sub quarter micron range | Hua-Tai Lin, Jhon Jhy Liaw, Jin-Yuan Lee | 2000-07-18 |
| 5894350 | Method of in line intra-field correction of overlay alignment | Shinn-Sheng Yu | 1999-04-13 |