JL

Jen-Cheng Liu

TSMC: 365 patents #21 of 12,232Top 1%
LL Lite-On Electronics (Guangzhou) Limited: 1 patents #237 of 534Top 45%
LI Lite-On It: 1 patents #106 of 223Top 50%
LT Lite-On Technology: 1 patents #549 of 1,203Top 50%
Overall (All Time): #781 of 4,157,543Top 1%
367
Patents All Time

Issued Patents All Time

Showing 1–25 of 367 patents

Patent #TitleCo-InventorsDate
12396283 3DIC seal ring structure and methods of forming same Cheng-Ying Ho, Pao-Tung Chen, Wen-De Wang, Dun-Nian Yaung 2025-08-19
12381195 Semiconductor devices and methods of manufacture thereof Shu-Ting Tsai, Dun-Nian Yaung, Szu-Ying Chen, U-Ting Chen 2025-08-05
12382744 Stacked substrate structure with inter-tier interconnection Jeng-Shyan Lin, Dun-Nian Yaung, Hsun-Ying Huang, Wei-Chih Weng, Yu-Yang Shen 2025-08-05
12363969 Passivation layer for epitaxial semiconductor process Yin-Kai Liao, Sin-Yi Jiang, Hsiang-Lin Chen, Yi-Shin Chu, Po-Chun Liu +2 more 2025-07-15
12322694 Metal-insulator-metal device with improved performance Min-Feng Kao, Dun-Nian Yaung, Hsing-Chih Lin, Kuan-Hua Lin 2025-06-03
12315843 Hybrid bonding technology for stacking integrated circuits Kuo-Ming Wu, Ching-Chun Wang, Dun-Nian Yaung, Hsing-Chih Lin, Min-Feng Kao +3 more 2025-05-27
12310137 Isolation structure to increase image sensor performance Yen-Ting Chiang, Yen-Yu Chen, Wen-Hao Chang, Tzu-Hsuan Hsu, Feng-Chi Hung +1 more 2025-05-20
12283564 Semiconductor structure and manufacturing method thereof Min-Feng Kao, Dun-Nian Yaung, Hsing-Chih Lin, Zheng-Xun Li 2025-04-22
12278250 Semiconductor device including image sensor and method of forming the same Min-Feng Kao, Dun-Nian Yaung, Hsing-Chih Lin, Feng-Chi Hung, Shyh-Fann Ting 2025-04-15
12255219 Image sensor with overlap of backside trench isolation structure and vertical transfer gate Feng-Chi Hung, Dun-Nian Yaung, Wei Chuang Wu, Yen-Yu Chen, Chih-Kuan Yu 2025-03-18
12230554 Shield structure for backside through substrate vias (TSVs) Min-Feng Kao, Dun-Nian Yaung, Hsing-Chih Lin, Wei-Tao Tsai 2025-02-18
12224298 Bond pad structure with high via density Yu-Hsien Li, Yen-Ting Chiang, Shyh-Fann Ting, Dun-Nian Yaung 2025-02-11
12218164 Semiconductor image-sensing structure and method for forming the same Ming-Hsien Yang, Wen-I Hsu, KUAN-FU LU, Feng-Chi Hung, Dun-Nian Yaung +2 more 2025-02-04
12218165 Semiconductor image sensor and method of manufacturing the same Min-Feng Kao, Dun-Nian Yaung, Hsing-Chih Lin, Che-Wei Chen 2025-02-04
12218106 Backside contact to improve thermal dissipation away from semiconductor devices Min-Feng Kao, Dun-Nian Yaung, Hsing-Chih Lin, Yi-Shin Chu, Ping-Tzu Chen +1 more 2025-02-04
12218166 CSI with controllable isolation structure and methods of manufacturing and using the same Min-Feng Kao, Dun-Nian Yaung, Wen-Chang Kuo, Shih-Han Huang 2025-02-04
12205868 Oversized via as through-substrate-via (TSV) stop layer Min-Feng Kao, Dun-Nian Yaung, Hsing-Chih Lin, Yi-Shin Chu, Ping-Tzu Chen 2025-01-21
12176370 Stacked structure for CMOS image sensors including through-substrate-via contacting negative bias circuit Min-Feng Kao, Dun-Nian Yaung, Wen-Chang Kuo, Sheng-Chau Chen, Feng-Chi Hung +1 more 2024-12-24
12154927 Semiconductor structure Yen-Ting Chiang, Chun-Yuan Chen, Hsiao-Hui Tseng, Sheng-Chan Li, Yu-Jen Wang +3 more 2024-11-26
12154939 High capacitance MIM device with self aligned spacer Ching-Sheng Chu, Dun-Nian Yaung, Yu-Cheng Tsai, Meng-Hsien Lin, Ching-Chung Su +2 more 2024-11-26
12148781 Image sensor device Szu-Ying Chen, Min-Feng Kao, Feng-Chi Hung, Dun-Nian Yaung 2024-11-19
12148782 Composite BSI structure and method of manufacturing the same Wei Chuang Wu, Dun-Nian Yaung, Feng-Chi Hung, Jhy-Jyi Sze, Keng-Yu Chou +3 more 2024-11-19
12142569 Integrated chip for standard logic performance improvement having a back-side through-substrate-via and method for forming the integrated chip Min-Feng Kao, Dun-Nian Yaung, Hsun-Ying Huang 2024-11-12
12062679 Backside structure for image sensor Min-Feng Kao, Dun-Nian Yaung, Wen-Chang Kuo, Shih-Han Huang 2024-08-13
12057412 Device crack-stop structure to prevent damage due to dicing crack Tung-Ting Wu, Chen-Jong Wang, Yimin Huang, Chin-Chia Kuo 2024-08-06