HL

Hsiao-Tzu Lu

TSMC: 10 patents #2,782 of 12,232Top 25%
SY Synopsys: 3 patents #460 of 2,302Top 20%
SC Synopsys Taiwan Co.: 1 patents #19 of 52Top 40%
Overall (All Time): #382,261 of 4,157,543Top 10%
13
Patents All Time

Issued Patents All Time

Showing 1–13 of 13 patents

Patent #TitleCo-InventorsDate
9852251 Manipulating parameterized cell devices in a custom layout design Duncan Robert McDonald, Chih-Wei Yuan, Wen-Lung Kang 2017-12-26
8969922 Field effect transistors and method of forming the same Chia-Chu Liu, Kuei-Shun Chen, Mu-Chi Chiang, Yao-Kwang Wu, Bi-Fen Wu +2 more 2015-03-03
8893069 Method of schematic driven layout creation Yu-Chi Su, Ming-Iu Lai 2014-11-18
8815496 Method for patterning a photosensitive layer Kuei-Shun Chen, Tsiao-Chen Wu, Vencent Chang, George Liu 2014-08-26
8707226 Manipulating parameterized cell devices in a custom layout design Duncan Robert McDonald, Chih-Wei Yuan, Wen-Lung Kang 2014-04-22
8394576 Method for patterning a photosensitive layer Kuei-Shun Chen, Tsiao-Chen Wu, Vencent Chang, George Liu 2013-03-12
8236579 Methods and systems for lithography alignment Hung-Chang Hsieh, Kuei-Shun Chen, Hsueh-Hung Fu, Ching-Hua Hsieh, Shau-Lin Shue 2012-08-07
8124323 Method for patterning a photosensitive layer Keui Shun Chen, Tsiao-Chen Wu, Vencent Chang, George Liu 2012-02-28
8119992 System for overlay measurement in semiconductor manufacturing Chin-Hsiang Lin, Hua-Shu Wu, Chia-Hsiang Lin, Kuei-Shun Chen 2012-02-21
7723014 System and method for photolithography in semiconductor manufacturing Kuei-Shun Chen, Chin-Hsiang Lin, Tsai-Cheng Gau, Chun-Kung Chen, Fu-Jye Liang 2010-05-25
7601466 System and method for photolithography in semiconductor manufacturing Yung-Sung Yen, Kuei-Shun Chen, Chia-Sui Hsu, Yuh-Sen Chang 2009-10-13
7582538 Method of overlay measurement for alignment of patterns in semiconductor manufacturing Chin-Hsiang Lin, Hua-Shu Wu, Chia-Hsiang Lin, Kuei-Shun Chen 2009-09-01
7479466 Method of heating semiconductor wafer to improve wafer flatness Burn Jeng Lin, Chin-Hsiang Lin, Kuei-Shun Chen, Tsai-Sheng Gau 2009-01-20