MK

Mikhail Korolik

Lam Research: 48 patents #34 of 2,128Top 2%
Applied Materials: 18 patents #731 of 7,310Top 10%
SG Silicon Genesis: 1 patents #28 of 40Top 70%
📍 San Jose, CA: #586 of 32,062 inventorsTop 2%
🗺 California: #4,767 of 386,348 inventorsTop 2%
Overall (All Time): #31,672 of 4,157,543Top 1%
67
Patents All Time

Issued Patents All Time

Showing 51–67 of 67 patents

Patent #TitleCo-InventorsDate
7737097 Method for removing contamination from a substrate and for making a cleaning solution Erik M. Freer, John M. de Larios, Katrina Mikhaylichenko, Michael Ravkin, Fred C. Redeker 2010-06-15
7709400 Thermal methods for cleaning post-CMP wafers Zhonghui Wang, Tiruchirapalli Arunagiri, Fritz Redeker, Yezdi Dordi, John M. Boyd +3 more 2010-05-04
7696141 Cleaning compound and method and system for using the cleaning compound Erik M. Freer, John M. de Larios, Katrina Mikhaylichenko, Michael Ravkin, Fred C. Redeker 2010-04-13
7648584 Method and apparatus for removing contamination from substrate Erik M. Freer, John M. de Larios, Katrina Mikhaylichenko, Michael Ravkin, Fred C. Redeker +2 more 2010-01-19
7632376 Method and apparatus for atomic layer deposition (ALD) in a proximity system Mike Ravkin, Mark Wilcoxson 2009-12-15
7615486 Apparatus and method for integrated surface treatment and deposition for copper interconnect Hyungsuk Alexander Yoon, Fritz Redeker, John M. Boyd, Yezdi Dordi 2009-11-10
7614411 Controls of ambient environment during wafer drying using proximity head John M. de Larios, Mike Ravkin, Jeffrey Farber 2009-11-10
7591613 Method and apparatus for transporting a substrate using non-newtonian fluid John M. de Larios, Mike Ravkin, John Parks, Fred C. Redeker 2009-09-22
7581875 Method and apparatus for thin metal film thickness measurement Yehiel Gotkis 2009-09-01
7568490 Method and apparatus for cleaning semiconductor wafers using compressed and/or pressurized foams, bubbles, and/or liquids John M. de Larios, Mike Ravkin, Jeffrey Farber, Fritz Redeker, Aleksander Owczarz 2009-08-04
7534307 Methods for processing wafer surfaces using thin, high velocity fluid layer Michael Ravkin, Michael G. R. Smith, John M. de Larios, Fritz Redeker, Christian DiPietro 2009-05-19
7416370 Method and apparatus for transporting a substrate using non-Newtonian fluid John M. de Larios, Mike Ravkin, John Parks, Fred C. Redeker 2008-08-26
7383843 Method and apparatus for processing wafer surfaces using thin, high velocity fluid layer Michael Ravkin, Michael G. R. Smith, John M. de Larios, Fritz Redeker, Christian DiPietro 2008-06-10
7367345 Apparatus and method for providing a confined liquid for immersion lithography David Hemker, Fred C. Redeker, John M. Boyd, John M. de Larios, Michael Ravkin 2008-05-06
7204639 Method and apparatus for thin metal film thickness measurement Yehiel Gotkis 2007-04-17
7078344 Stress free etch processing in combination with a dynamic liquid meniscus Andrew D. Bailey, III, Michael Ravkin, Puneet Yadav 2006-07-18
6534381 Method for fabricating multi-layered substrates Nathan W. Cheung, William G. En, Sharon N. Farrens 2003-03-18