Issued Patents All Time
Showing 51–75 of 92 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8283631 | In-situ differential spectroscopy | Mehdi Vaez-Iravani, Mehran Nasser-Ghodsi | 2012-10-09 |
| 8194240 | Enhanced focusing capability on a sample using a spot matrix | Mehdi Vaez-Iravani, Stan Stokowski | 2012-06-05 |
| 8194301 | Multi-spot scanning system and method | Rex Runyon, Mehdi Vaez-Iravani | 2012-06-05 |
| 7989729 | Detecting and repairing defects of photovoltaic devices | George H. Zapalac, Jr., Samuel Ngai, Ady Levy, Mehdi Vaez-Iravani | 2011-08-02 |
| 7869023 | System for detecting anomalies and/or features of a surface | Stanley Stokowski, Mehdi Vaez-Iravani | 2011-01-11 |
| 7821654 | System for scatterometric measurements and applications | Anatoly Fabrikant, Daniel Wack, Mehrdad Nikoonahad | 2010-10-26 |
| 7733111 | Segmented optical and electrical testing for photovoltaic devices | Bin-Ming Benjamin Tsai, Mehdi Vaez-Iravani, Ady Levy, George H. Zapalac, Jr., Samuel Ngai | 2010-06-08 |
| 7709794 | Defect detection using time delay lock-in thermography (LIT) and dark field LIT | Geordie Zapalac, Samuel Ngai, Mehdi Vaez-Iravani, Ady Levy, Vineet Dharmadhikari | 2010-05-04 |
| 7607647 | Stabilizing a substrate using a vacuum preload air bearing chuck | Alexander Belyaev, Christian Wolters, Paul Doyle, Howard Dando, Mehdi Vaez-Iravani | 2009-10-27 |
| 7564544 | Method and system for inspecting surfaces with improved light efficiency | Zheng Yan, Bo Li, Wayne Chen | 2009-07-21 |
| 7525649 | Surface inspection system using laser line illumination with two dimensional imaging | Jenn-Kuen Leong, Mehdi Vaez-Iravani | 2009-04-28 |
| 7515253 | System for measuring a sample with a layer containing a periodic diffracting structure | Noah Bareket, Daniel Wack | 2009-04-07 |
| 7511830 | System for scatterometric measurements and applications | Anatloy Fabrikant, Daniel Wack, Mehrdad Nikoonahad | 2009-03-31 |
| 7433037 | System for measuring periodic structures | Kenneth P. Gross, Rodney Smedt, Mehrdad Nikoonahad | 2008-10-07 |
| 7375810 | Overlay error detection | Mehrdad Nikoonahad, Andrei V. Shchegrov, Ben-ming Benjamin Tsai | 2008-05-20 |
| 7369233 | Optical system for measuring samples using short wavelength radiation | Mehrdad Nikoonahad, Shing Lee, Hidong Kwak, Sergio Edelstein, Gary Janik | 2008-05-06 |
| 7345754 | Fourier filters and wafer inspection systems | Mehdi Vaez-Iravani, Andrew V. Hill, Avijit K. Ray-Chaudhuri | 2008-03-18 |
| 7319229 | Illumination apparatus and methods | Mehdi Vaez-Iravani, Stanley Stokowski | 2008-01-15 |
| 7301649 | System for scatterometric measurements and applications | Anatoly Fabrikant, Daniel Wack, Mehrdad Nikoonahad | 2007-11-27 |
| 7295303 | Methods and apparatus for inspecting a sample | Mehdi Vaez-Iravani | 2007-11-13 |
| 7280199 | System for detecting anomalies and/or features of a surface | Stanley Stokowski, Mehdi Vaez-Iravani | 2007-10-09 |
| 7221444 | Method and system for improved defect sensitivity for inspecting surfaces | — | 2007-05-22 |
| 7119897 | Sample inspection system | Mehdi Vaez-Iravani, Stanley Stokowski | 2006-10-10 |
| 7099005 | System for scatterometric measurements and applications | Anatoly Fabrikant, Daniel Wack, Mehrdad Nikoonahad | 2006-08-29 |
| 7088443 | System for detecting anomalies and/or features of a surface | Mehdi Vaez-Iravani, Stanley Stokowski | 2006-08-08 |