AF

Anatoly Fabrikant

KL Kla-Tencor: 18 patents #566 of 1,394Top 45%
AD Amo Development: 11 patents #21 of 167Top 15%
AU Amo Manufacturing Usa: 1 patents #29 of 45Top 65%
📍 Fremont, CA: #507 of 9,298 inventorsTop 6%
🗺 California: #17,156 of 386,348 inventorsTop 5%
Overall (All Time): #124,785 of 4,157,543Top 4%
30
Patents All Time

Issued Patents All Time

Showing 1–25 of 30 patents

Patent #TitleCo-InventorsDate
10292864 Wavefront measurement pre-smoothing systems and methods Dimitri Chernyak, Guang-ming Dai, Jayesh Shah 2019-05-21
10179070 Systems and methods for laser beam direct measurement and error budget Ihor V. Berezhnyy, Guangming Dai, Benjamin A. Logan, Anthony Tang, Henry Price +1 more 2019-01-15
10098783 Tilt compensation, measurement, and associated adjustment of refractive prescriptions during surgical and other treatments of the eye Dimitri Chernyak 2018-10-16
10098785 Treatment validation systems and methods Guang-ming Dai, Dimitri Chernyak, Jayesh Shah 2018-10-16
10028862 Compensation systems and methods for flap induced aberrations Guang-ming Dai, Stanley S. Bentow 2018-07-24
9814620 Systems and methods for treatment deconvolution using multi-scale kernels Guang-ming Dai, Dimitri Chernyak 2017-11-14
9659151 Systems and methods for treatment target deconvolution Guang-ming Dai, Dimitri Chernyak 2017-05-23
9655513 Wavefront measurement pre-smoothing systems and methods Dimitri Chernyak, Guang-ming Dai, Jayesh Shah 2017-05-23
9510747 System and method for ophthalmic surface measurements based on objective quality estimation 2016-12-06
9501621 Treatment validation systems and methods Guang-ming Dai, Dimitri Chernyak, Jayesh Shah 2016-11-22
9498117 Systems and methods for treatment deconvolution using dual scale kernels Guang-ming Dai, Dimitri Chernyak 2016-11-22
8978660 Tilt compensation, measurement, and associated adjustment of refractive prescriptions during surgical and other treatments of the eye Dimitri Chernyak 2015-03-17
7933016 Apparatus and methods for detecting overlay errors using scatterometry Walter D. Mieher, Ady Levy, Boris Golovanevsky, Michael Friedmann, Ian Smith +10 more 2011-04-26
7876440 Apparatus and methods for detecting overlay errors using scatterometry Walter D. Mieher, Ady Levy, Boris Golovanesky, Michael Friedmann, Ian Smith +1 more 2011-01-25
7826071 Parametric profiling using optical spectroscopic systems Andrei V. Shchegrov, Mehrdad Nikoonahad, Ady Levy, Daniel Wack, Noah Bareket +2 more 2010-11-02
7821654 System for scatterometric measurements and applications Guoheng Zhao, Daniel Wack, Mehrdad Nikoonahad 2010-10-26
7663753 Apparatus and methods for detecting overlay errors using scatterometry Walter D. Mieher, Ady Levy, Boris Golovanevsky, Michael Friedmann, Ian Smith +10 more 2010-02-16
7564557 Apparatus and methods for detecting overlay errors using scatterometry Walter D. Mieher, Ady Levy, Boris Golovanesky, Michael Friedmann, Ian Smith +1 more 2009-07-21
7433040 Apparatus and methods for detecting overlay errors using scatterometry Walter D. Mieher, Ady Levy, Boris Golovanesky, Michael Friedmann, Ian Smith +3 more 2008-10-07
7385699 Apparatus and methods for detecting overlay errors using scatterometry Walter D. Mieher, Ady Levy, Boris Golovanesky, Michael Friedmann, Ian Smith +3 more 2008-06-10
7317531 Apparatus and methods for detecting overlay errors using scatterometry Walter D. Mieher, Ady Levy, Boris Golovanesky, Michael Friedmann, Ian Smith +10 more 2008-01-08
7312881 Parametric profiling using optical spectroscopic systems to adjust processing parameter Andrei V. Shchegrov, Mehrdad Nikoonahad 2007-12-25
7301634 Apparatus and methods for detecting overlay errors using scatterometry Walter D. Mieher, Ady Levy, Boris Golovanesky, Michael Friedmann, Ian Smith +7 more 2007-11-27
7301649 System for scatterometric measurements and applications Guoheng Zhao, Daniel Wack, Mehrdad Nikoonahad 2007-11-27
7298481 Apparatus and methods for detecting overlay errors using scatterometry Walter D. Mieher, Ady Levy, Boris Golovanevsky, Michael Friedmann, Ian Smith +4 more 2007-11-20