GZ

Guoheng Zhao

KL Kla-Tencor: 71 patents #6 of 1,394Top 1%
Applied Materials: 16 patents #838 of 7,310Top 15%
KL Kla: 2 patents #202 of 758Top 30%
📍 Palo Alto, CA: #130 of 9,675 inventorsTop 2%
🗺 California: #2,615 of 386,348 inventorsTop 1%
Overall (All Time): #17,028 of 4,157,543Top 1%
92
Patents All Time

Issued Patents All Time

Showing 76–92 of 92 patents

Patent #TitleCo-InventorsDate
7079238 Sample inspection system Mehdi Vaez-Iravani, Stanley Stokowski 2006-07-18
7064821 Sample inspection system Mehdi Vaez-Iravani, Stanley Stokowski 2006-06-20
7009704 Overlay error detection Mehrdad Nikoonahad, Andrei V. Shchegrov, Ben-ming Benjamin Tsai 2006-03-07
6891611 Sample inspection system Mehdi Vaez-Iravani, Stanley Stokowski 2005-05-10
6753528 System for MEMS inspection and characterization Mehrdad Nikoonahad 2004-06-22
6724473 Method and system using exposure control to inspect a surface Jenn-Kuen Leong, Mehdi Vaez-Iravani 2004-04-20
6721052 Systems for measuring periodic structures Kenneth P. Gross, Rodney Smedt, Mehrdad Nikoonahad 2004-04-13
6710876 Metrology system using optical phase Mehrdad Nikoonahad, Ian Smith, Mehdi Vaez-Iravani 2004-03-23
6707540 In-situ metalization monitoring using eddy current and optical measurements Kurt Lehman, Shing Lee, Walter H. Johnson, John Fielden, Mehrdad Nikoonahad 2004-03-16
6671051 Apparatus and methods for detecting killer particles during chemical mechanical polishing Mehrdad Nikoonahad, Anantha R. Sethuraman 2003-12-30
6657715 Sample inspection system Mehdi Vaez-Iravani, Stanley Stokowski 2003-12-02
6639662 Sample inspection system Mehdi Vaez-Iravani, Stanley Stokowski 2003-10-28
6628397 Apparatus and methods for performing self-clearing optical measurements Mehrdad Nikoonahad, Shing Lee, Kalman Kele, Kurt Lehman 2003-09-30
6618134 Sample inspection system Mehdi Vaez-Iravani, Stanley Stokowski 2003-09-09
6608676 System for detecting anomalies and/or features of a surface Stanley Stokowski, Mehdi Vaez-Iravani 2003-08-19
6384910 Sample inspection system Mehdi Vaez-Iravani, Stanley Stokowski 2002-05-07
6201601 Sample inspection system Mehdi Vaez-Iravani, Stanley Stokowski 2001-03-13