Issued Patents All Time
Showing 1–18 of 18 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12106930 | Charged particle beam device | Go Miya, Kazuma Tanii, Seiichiro Kanno | 2024-10-01 |
| 11749494 | Charged particle beam apparatus | Yohei Nakamura, Natsuki Tsuno, Heita Kimizuka, Muneyuki Fukuda | 2023-09-05 |
| 11735394 | Charged particle beam apparatus | Seiichiro Kanno, Go Miya | 2023-08-22 |
| 11646172 | Charged particle beam apparatus | Yohei Nakamura, Natsuki Tsuno, Heita Kimizuka, Muneyuki Fukuda | 2023-05-09 |
| 11398367 | Charged particle beam apparatus | Yohei Nakamura, Natsuki Tsuno, Heita Kimizuka, Muneyuki Fukuda | 2022-07-26 |
| 11398366 | Charged particle beam apparatus | Yohei Nakamura, Natsuki Tsuno, Heita Kimizuka, Muneyuki Fukuda | 2022-07-26 |
| 11380518 | Measurement system and method for setting observation conditions of measurement apparatus | Hirokazu Tamaki, Momoyo Enyama, Makoto Sakakibara, Sayaka KURATA, Atsuko Shintani +6 more | 2022-07-05 |
| 11335535 | Charged particle beam apparatus | Yohei Nakamura, Heita Kimizuka, Natsuki Tsuno, Muneyuki Fukuda | 2022-05-17 |
| 11143606 | Particle measuring device and particle measuring method | Tomihiro Hashizume, Masatoshi Yasutake, Tsunenori Nomaguchi | 2021-10-12 |
| 11043359 | Charged particle beam apparatus and charged particle beam inspection system | Yohei Nakamura, Natsuki Tsuno, Heita Kimizuka, Muneyuki Fukuda, Junichi Tanaka | 2021-06-22 |
| 11011348 | Scanning electron microscope and sample observation method using scanning electron microscope | Daisuke Bizen, Natsuki Tsuno, Makoto Sakakibara, Toshiyuki Yokosuka, Hideyuki Kazumi | 2021-05-18 |
| 10872742 | Charged particle beam device | Seiichiro Kanno, Go Miya | 2020-12-22 |
| 10134558 | Scanning electron microscope | Yasunari Sohda, Takeyoshi Ohashi, Noritsugu Takahashi, Hajime Kawano | 2018-11-20 |
| 9799486 | Charged particle beam apparatus for measuring surface potential of a sample | Seiichiro Kanno, Yasushi Ebizuka, Go Miya | 2017-10-24 |
| 9543053 | Electron beam equipment | Yasunari Sohda, Takeyoshi Ohashi, Hajime Kawano | 2017-01-10 |
| 9236220 | Electronic microscope, setting method of observation condition of electronic microscope, and observation method using electronic microscope | Natsuki Tsuno, Hideyuki Kazumi, Yoshinobu Kimura, Hajime Kawano | 2016-01-12 |
| 9202668 | Observation specimen for use in electron microscopy, electron microscopy, electron microscope, and device for producing observation specimen | Yoichi Ose, Eiko Nakazawa, Mami Konomi, Shunya Watanabe, Yoshinobu Kimura +1 more | 2015-12-01 |
| 8907279 | Electron microscope and image capturing method using electron beam | Natsuki Tsuno, Hideyuki Kazumi, Yuzuru Mochizuki, Yoshinobu Kimura, Toshiyuki Yokosuka | 2014-12-09 |