VB

Veeraraghavan S. Basker

IBM: 426 patents #36 of 70,183Top 1%
Globalfoundries: 26 patents #104 of 4,424Top 3%
TE Tessera: 7 patents #62 of 271Top 25%
RE Renesas Electronics: 3 patents #1,322 of 4,529Top 30%
GU Globalfoundries U.S.: 3 patents #206 of 665Top 35%
AS Adeia Semiconductor Solutions: 2 patents #9 of 57Top 20%
SS Stmicroelectronics Sa: 1 patents #938 of 1,676Top 60%
ET Elpis Technologies: 1 patents #31 of 121Top 30%
FS Freeescale Semiconductor: 1 patents #2,021 of 3,767Top 55%
KT Kabushiki Kaisha Toshiba: 1 patents #13,537 of 21,451Top 65%
📍 Schenectady, NY: #3 of 1,353 inventorsTop 1%
🗺 New York: #25 of 115,490 inventorsTop 1%
Overall (All Time): #452 of 4,157,543Top 1%
462
Patents All Time

Issued Patents All Time

Showing 426–450 of 462 patents

Patent #TitleCo-InventorsDate
8835250 FinFET trench circuit Jonathan E. Faltermeier, Kangguo Cheng, Theodorus E. Standaert 2014-09-16
8815668 Preventing FIN erosion and limiting Epi overburden in FinFET structures by composite hardmask Effendi Leobandung, Tenko Yamashita, Chun-Chen Yeh 2014-08-26
8815661 MIM capacitor in FinFET structure Effendi Leobandung, Tenko Yamashita, Chun-Chen Yeh 2014-08-26
8815670 Preventing Fin erosion and limiting EPI overburden in FinFET structures by composite hardmask Effendi Leobandung, Tenko Yamashita, Chun-Chen Yeh 2014-08-26
8816420 MIM capacitor in finFET structure Effendi Leobandung, Tenko Yamashita, Chun-Chen Yeh 2014-08-26
8766363 Method and structure for forming a localized SOI finFET Kangguo Cheng, Bruce B. Doris, Ali Khakifirooz, Kern Rim 2014-07-01
8723262 SOI FinFET with recessed merged fins and liner for enhanced stress coupling Huiming Bu, Effendi Leobandung, Theodorus E. Standaert, Tenko Yamashita, Chun-Chen Yeh 2014-05-13
8722494 Dual gate finFET devices Effendi Leobandung, Tenko Yamashita 2014-05-13
8716797 FinFET spacer formation by oriented implantation Chang Kangguo, Bruce B. Doris, Johnathan E. Faltermeier 2014-05-06
8703572 Embeded DRAM cell structures with high conductance electrodes and methods of manufacture Richard Q. Williams 2014-04-22
8698318 Superfilled metal contact vias for semiconductor devices James J. Kelly, Balasubramanian S. Pranatharthi Haran, Soon-Cheon Seo, Tuan A. Vo 2014-04-15
8679902 Stacked nanowire field effect transistor Tenko Yamashita, Chun-Chen Yeh 2014-03-25
8673729 finFET eDRAM strap connection structure Effendi Leobandung, Tenko Yamashita, Chun-Chen Yeh 2014-03-18
8674476 Anti-fuse device structure and electroplating circuit structure and method Toshiharu Furukawa, William R. Tonti 2014-03-18
8637931 finFET with merged fins and vertical silicide Andres Bryant, Huiming Bu, Wilfried E. Haensch, Effendi Leobandung, Chung-Hsun Lin +3 more 2014-01-28
8592290 Cut-very-last dual-EPI flow Huiming Bu, Kangguo Cheng, Balasubramanian S. Haran, Nicolas Loubet, Shom Ponoth +3 more 2013-11-26
8569152 Cut-very-last dual-epi flow Huiming Bu, Kangguo Cheng, Balasubramanian S. Haran, Nicolas Loubet, Shom Ponoth +3 more 2013-10-29
8557657 Retrograde substrate for deep trench capacitors Wilfried E. Haensch, Effendi Leobandung, Tenko Yamashita, Chun-Chen Yeh 2013-10-15
8551313 Method and apparatus for electroplating on soi and bulk semiconductor wafers Eduard A. Cartier, Hariklia Deligianni, Rajarao Jammy, Vamsi K. Paruchuri 2013-10-08
8513073 Silicon germanium channel with silicon buffer regions for fin field effect transistor device Tenko Yamashita, Chun-Chun Yeh 2013-08-20
8507187 Multi-exposure lithography employing a single anti-reflective coating layer Willard E. Conley, Steven J. Holmes, David V. Horak 2013-08-13
8455313 Method for fabricating finFET with merged fins and vertical silicide Andres Bryant, Huiming Bu, Wilfried E. Haensch, Effendi Leobandung, Chung-Hsun Lin +3 more 2013-06-04
8445334 SOI FinFET with recessed merged Fins and liner for enhanced stress coupling Huiming Bu, Effendi Leobandung, Theodorus E. Standaert, Tenko Yamashita, Chun-Chen Yeh 2013-05-21
8420464 Spacer as hard mask scheme for in-situ doping in CMOS finFETs Kangguo Cheng, Bruce B. Doris, Johnathan E. Faltermeier, Sivananda K. Kanakasabapathy, Hemant Adhikari 2013-04-16
8377795 Cut first methodology for double exposure double etch integration Sivananda K. Kanakasabapathy, Balasubramanian S. Haran 2013-02-19