Jonathan E. Faltermeier — 5 Patents at IBM

Jonathan E. Faltermeier has been granted 5 US patents while listed as an inventor at IBM. The first was granted in 2000 and the most recent in July 2016. Jonathan E. Faltermeier ranks #907,971 of 4,157,543 US inventors in our database (top 21.8%). Patent records list Jonathan E. Faltermeier in Delanson, NY, US.

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Showing 1–5 of 5 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
9401303	Handler wafer removal by use of sacrificial inert layer	Kangguo Cheng, Mukta G. Farooq, Wei Lin, Spyridon Skordas, Kevin R. Winstel	2016-07-26	$8,130,000
8835250	FinFET trench circuit	Veeraraghavan S. Basker, Kangguo Cheng, Theodorus E. Standaert	2014-09-16	$3,547,000
6767781	Structure and method of forming bitline contacts for a vertical DRAM array using a line bitline contact mask	Larry Nesbit, Ramachandra Divakaruni, Wolfgang Bergner	2004-07-27
6534133	Methodology for in-situ doping of aluminum coatings	Alain E. Kaloyeros, Andres Emaranza Knorr	2003-03-18
6077571	Conformal pure and doped aluminum coatings and a methodology and apparatus for their preparation	Alain E. Kaloyeros	2000-06-20

Jonathan E. Faltermeier — 5 Patents

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