Issued Patents All Time
Showing 25 most recent of 27 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12300615 | Infrared debond damage mitigation by copper fill pattern | Mukta G. Farooq, Qianwen Chen, Eric D. Perfecto, Michael P. Belyansky, Katsuyuki Sakuma +1 more | 2025-05-13 |
| 10446442 | Integrated circuit chip with molding compound handler substrate and method | Christopher L. Tessler | 2019-10-15 |
| 9230637 | SRAM circuit with increased write margin | Pamela Castalino, Harold Pilo | 2016-01-05 |
| 9059021 | FinFET device | Robert C. Wong | 2015-06-16 |
| 8697514 | FinFET device | Robert C. Wong | 2014-04-15 |
| 7727825 | Polyconductor line end formation and related mask | Allen H. Gabor, Donald J. Samuels | 2010-06-01 |
| 7541613 | Methods for reducing within chip device parameter variations | Brent A. Anderson, Allen H. Gabor, Patrick Edward Lindo, Edward J. Nowak, Jed H. Rankin | 2009-06-02 |
| 7465615 | Polyconductor line end formation and related mask | Allen H. Gabor, Donald J. Samuels | 2008-12-16 |
| 7439001 | Focus blur measurement and control method | Christopher P. Ausschnitt, Timothy A. Brunner, Daniel A. Corliss | 2008-10-21 |
| 7413833 | Single exposure of mask levels having a lines and spaces array using alternating phase-shift mask | Scott Bukofsky, Ramachandra Divakaruni, Carl Radens, Wayne F. Ellis | 2008-08-19 |
| 7393703 | Method for reducing within chip device parameter variations | Brent A. Anderson, Allen H. Gabor, Patrick Edward Lindo, Edward J. Nowak, Jed H. Rankin | 2008-07-01 |
| 7074525 | Critical dimension control of printed features using non-printing fill patterns | Chung-Hsi Wu, Timothy A. Brunner, Patrick Speno | 2006-07-11 |
| 7074529 | Phase-shift mask | Gerhard Kunkel | 2006-07-11 |
| 7056628 | Mask for projecting a structure pattern onto a semiconductor substrate | Henning Haffner | 2006-06-06 |
| 7016027 | System and method for quantifying errors in an alternating phase shift mask | Shoaib Zaidi | 2006-03-21 |
| 6940583 | Method and apparatus for amplitude filtering in the frequency plane of a lithographic projection system | Martin Burkhardt | 2005-09-06 |
| 6842222 | Method of reducing pitch on semiconductor wafer | Gerhard Kunkel, Alan C. Thomas, Juergen Preuninger | 2005-01-11 |
| 6670646 | Mask and method for patterning a semiconductor wafer | Zhijian Lu, Alois Gutmann | 2003-12-30 |
| 6606151 | Grating patterns and method for determination of azimuthal and radial aberration | Gerhard Kunkel, Joseph P. Kirk | 2003-08-12 |
| 6590657 | Semiconductor structures and manufacturing methods | Christian Summerer, Gerhard Kunkel, Uwe Schroeder | 2003-07-08 |
| 6571383 | Semiconductor device fabrication using a photomask designed using modeling and empirical testing | Henning Haffner, Beate Frankowsky | 2003-05-27 |
| 6566219 | Method of forming a self aligned trench in a semiconductor using a patterned sacrificial layer for defining the trench opening | Gerhard Kunkel, Ramachandra Divakaruni, Armin Reith, Munir D. Naeem | 2003-05-20 |
| 6421820 | Semiconductor device fabrication using a photomask with assist features | Scott M. Mansfield, Lars Liebmann, Henning Haffner | 2002-07-16 |
| 6316168 | Top layer imaging lithography for semiconductor processing | Uwe Schroeder | 2001-11-13 |
| 6282116 | Dynamic random access memory | Gerhard Kunkel, Carl Radens | 2001-08-28 |