Issued Patents All Time
Showing 1–16 of 16 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8189374 | Memory device including an electrode having an outer portion with greater resistivity | — | 2012-05-29 |
| 7973301 | Low power phase change memory cell with large read signal | Thomas Happ, Jan Boris Philipp | 2011-07-05 |
| 7824951 | Method of fabricating an integrated circuit having a memory including a low-k dielectric material | Thomas Happ | 2010-11-02 |
| 7760546 | Integrated circuit including an electrode having an outer portion with greater resistivity | — | 2010-07-20 |
| 7718467 | Memory device | — | 2010-05-18 |
| 7718464 | Integrated circuit fabricated using an oxidized polysilicon mask | — | 2010-05-18 |
| 7427774 | Targets for measurements in semiconductor devices | Ulrich Mantz, Christopher Gould | 2008-09-23 |
| 7408240 | Memory device | — | 2008-08-05 |
| 7388667 | Optical determination of resistivity of phase change materials | Thomas Happ | 2008-06-17 |
| 7361925 | Integrated circuit having a memory including a low-k dielectric material for thermal isolation | Thomas Happ | 2008-04-22 |
| 7016027 | System and method for quantifying errors in an alternating phase shift mask | Shahid Butt | 2006-03-21 |
| 6954002 | System and method of enhancing alignment marks | Gary Williams, Alois Gutmann | 2005-10-11 |
| 6888260 | Alignment or overlay marks for semiconductor processing | Enio Carpi | 2005-05-03 |
| 6724479 | Method for overlay metrology of low contrast features | — | 2004-04-20 |
| 6687014 | Method for monitoring the rate of etching of a semiconductor | Gangadhara S. Mathad | 2004-02-03 |
| 6548314 | Method for enabling access to micro-sections of integrated circuits on a wafer | — | 2003-04-15 |